{"title":"绝缘体上硅衬底侧双极结晶体管的射频模型","authors":"D. Lee, I.-S.M. Sun, W. Ng","doi":"10.1109/EDSSC.2005.1635270","DOIUrl":null,"url":null,"abstract":"A methodology for modelling a novel highfrequency lateral bipolar junction transistor (LBJT) is described. A modified SPICE-Gummel-Poon (SGP) model is used to simulate the device, with the SGP parameters determined based on the transistor's physical geometry. DC, AC, and S-parameter simulations using this model are verified against measured data. The results show good matching and demonstrates that the novel geometry of the LBJT facilitates modelling by reducing the influence of second order effects.","PeriodicalId":429314,"journal":{"name":"2005 IEEE Conference on Electron Devices and Solid-State Circuits","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"RF Model of Lateral Bipolar Junction Transistor on Silicon-on-Insulator Substrate\",\"authors\":\"D. Lee, I.-S.M. Sun, W. Ng\",\"doi\":\"10.1109/EDSSC.2005.1635270\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A methodology for modelling a novel highfrequency lateral bipolar junction transistor (LBJT) is described. A modified SPICE-Gummel-Poon (SGP) model is used to simulate the device, with the SGP parameters determined based on the transistor's physical geometry. DC, AC, and S-parameter simulations using this model are verified against measured data. The results show good matching and demonstrates that the novel geometry of the LBJT facilitates modelling by reducing the influence of second order effects.\",\"PeriodicalId\":429314,\"journal\":{\"name\":\"2005 IEEE Conference on Electron Devices and Solid-State Circuits\",\"volume\":\"39 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-12-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2005 IEEE Conference on Electron Devices and Solid-State Circuits\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDSSC.2005.1635270\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 IEEE Conference on Electron Devices and Solid-State Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDSSC.2005.1635270","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
RF Model of Lateral Bipolar Junction Transistor on Silicon-on-Insulator Substrate
A methodology for modelling a novel highfrequency lateral bipolar junction transistor (LBJT) is described. A modified SPICE-Gummel-Poon (SGP) model is used to simulate the device, with the SGP parameters determined based on the transistor's physical geometry. DC, AC, and S-parameter simulations using this model are verified against measured data. The results show good matching and demonstrates that the novel geometry of the LBJT facilitates modelling by reducing the influence of second order effects.
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