用于CABGA(R)封装的高可靠性和环保型成型化合物

Byung-Seon Kong, Hyo-Chang Yun, Jong-Chan Lim, Y. Jung, Dong-Young Kim, Kwan-Seek Chung
{"title":"用于CABGA(R)封装的高可靠性和环保型成型化合物","authors":"Byung-Seon Kong, Hyo-Chang Yun, Jong-Chan Lim, Y. Jung, Dong-Young Kim, Kwan-Seek Chung","doi":"10.1109/ECTC.2001.928015","DOIUrl":null,"url":null,"abstract":"In this study, four kind of epoxy resins (biphenyl, naphthol, multi-functional, and OCN type) have applied to molding compound for CABGA packages. Basic, thermal, and mechanical properties of all molding compounds were measured and compared with moldability (coplanarity and wire sweep) and reliability (moisture sensitivity level) in the CABGA packages. From factor study, it was clear that molding compound which had high Tg and low shrinkage represents low coplanarity of CABGA packages. Coplanarity of MAP-type CABGA package decreased with increasing Tg and decreasing shrinkage of molding compound. Especially, coplanarity of the said package was found to be linearly proportional to the difference of shrinkage between PCB substrate and molding compound at room temperature. In case of reliability, the amount of absorbed moisture and flexural modulus of molding compounds affected on moisture sensitivity level. Low moisture absorption and flexural modulus are profitable for high reliability-JEDEC Level 3, 30/spl deg/C/60%RH/192 hours at reflow temperature 260/spl deg/C.","PeriodicalId":340217,"journal":{"name":"2001 Proceedings. 51st Electronic Components and Technology Conference (Cat. No.01CH37220)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"High reliable and environmental friendly molding compound for CABGA(R) packages\",\"authors\":\"Byung-Seon Kong, Hyo-Chang Yun, Jong-Chan Lim, Y. Jung, Dong-Young Kim, Kwan-Seek Chung\",\"doi\":\"10.1109/ECTC.2001.928015\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this study, four kind of epoxy resins (biphenyl, naphthol, multi-functional, and OCN type) have applied to molding compound for CABGA packages. Basic, thermal, and mechanical properties of all molding compounds were measured and compared with moldability (coplanarity and wire sweep) and reliability (moisture sensitivity level) in the CABGA packages. From factor study, it was clear that molding compound which had high Tg and low shrinkage represents low coplanarity of CABGA packages. Coplanarity of MAP-type CABGA package decreased with increasing Tg and decreasing shrinkage of molding compound. Especially, coplanarity of the said package was found to be linearly proportional to the difference of shrinkage between PCB substrate and molding compound at room temperature. In case of reliability, the amount of absorbed moisture and flexural modulus of molding compounds affected on moisture sensitivity level. Low moisture absorption and flexural modulus are profitable for high reliability-JEDEC Level 3, 30/spl deg/C/60%RH/192 hours at reflow temperature 260/spl deg/C.\",\"PeriodicalId\":340217,\"journal\":{\"name\":\"2001 Proceedings. 51st Electronic Components and Technology Conference (Cat. No.01CH37220)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-05-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2001 Proceedings. 51st Electronic Components and Technology Conference (Cat. No.01CH37220)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.2001.928015\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2001 Proceedings. 51st Electronic Components and Technology Conference (Cat. No.01CH37220)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2001.928015","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

本研究将四种环氧树脂(联苯型、萘酚型、多功能型和OCN型)应用于CABGA封装的成型复合材料中。测量了所有成型化合物的基本性能、热学性能和机械性能,并将其与CABGA封装中的可塑性(共面性和钢丝扫描)和可靠性(湿度敏感性水平)进行了比较。从因子分析可知,高Tg、低收缩率的模塑复合材料代表了CABGA封装的低共面性。map型CABGA封装的共面性随着成型材料Tg的增加和收缩率的降低而降低。特别是,在所述封装的共面性发现与PCB基板和成型化合物在室温下的收缩率差成线性比例。在可靠性的情况下,模塑复合材料的吸湿量和弯曲模量对水分敏感程度有影响。低吸湿和弯曲模量有利于高可靠性- jedec级别3,30 /spl°C/60%RH/192小时回流温度260/spl°C。
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High reliable and environmental friendly molding compound for CABGA(R) packages
In this study, four kind of epoxy resins (biphenyl, naphthol, multi-functional, and OCN type) have applied to molding compound for CABGA packages. Basic, thermal, and mechanical properties of all molding compounds were measured and compared with moldability (coplanarity and wire sweep) and reliability (moisture sensitivity level) in the CABGA packages. From factor study, it was clear that molding compound which had high Tg and low shrinkage represents low coplanarity of CABGA packages. Coplanarity of MAP-type CABGA package decreased with increasing Tg and decreasing shrinkage of molding compound. Especially, coplanarity of the said package was found to be linearly proportional to the difference of shrinkage between PCB substrate and molding compound at room temperature. In case of reliability, the amount of absorbed moisture and flexural modulus of molding compounds affected on moisture sensitivity level. Low moisture absorption and flexural modulus are profitable for high reliability-JEDEC Level 3, 30/spl deg/C/60%RH/192 hours at reflow temperature 260/spl deg/C.
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