FPGA物理合成中的功耗和容错优化

Manu Jose, Yu Hu, R. Majumdar
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引用次数: 3

摘要

在FPGA合成中,功耗和容错被认为是两个正交的优化目标,分别尝试开发算法和CAD工具来优化每个目标。在本文中,我们研究了这两种优化之间的关系,并通过经验证明它们之间存在很强的联系。具体来说,我们分析了FPGA物理合成(即封装、放置和路由)中的功率和可靠性优化问题,并表明这两个问题的内在结构非常相似。通过对广泛选择的基准电路进行详细的功率和可靠性分析的后路由结果的支持,我们表明,只需进行最小的更改(少于100行C代码),就可以使用现有的功率感知物理合成工具将电路在SEU故障下的故障率降至最低。作为本研究的副产品,我们还表明,通过对fpga执行容错物理合成,可以将平均故障时间提高100%,而面积和延迟开销可以忽略不计。这项研究的结果显示了开发协同优化功率和容错的CAD系统的巨大潜力。
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On power and fault-tolerance optimization in FPGA physical synthesis
Power and fault tolerance are deemed to be two orthogonal optimization objectives in FPGA synthesis, with independent attempts to develop algorithms and CAD tools to optimize each objective. In this paper, we study the relationship between these two optimizations and show empirically that there are strong ties between them. Specifically, we analyze the power and reliability optimization problems in FPGA physical synthesis (i.e., packing, placement, and routing), and show that the intrinsic structures of these two problems are very similar. Supported by the post routing results with detailed power and reliability analysis for a wide selection of benchmark circuits, we show that with minimal changes — fewer than one hundred lines of C code — an existing power-aware physical synthesis tool can be used to minimize the fault rate of a circuit under SEU faults. As a by-product of this study, we also show that one can improve the mean-time-to-failure by 100% with negligible area and delay overhead by performing fault-tolerant physical synthesis for FPGAs. The results from this study show a great potential to develop CAD systems co-optimized for power and fault-tolerance.
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