Sabyasachi Deyati, B. Muldrey, A. Singh, A. Chatterjee
{"title":"基于物理不可克隆功能的模拟推拉放大器硬件安全挑战工程与设计","authors":"Sabyasachi Deyati, B. Muldrey, A. Singh, A. Chatterjee","doi":"10.1109/ATS.2015.29","DOIUrl":null,"url":null,"abstract":"In the recent past, Physically Unclonable Functions (PUFs) have been proposed as a way of implementing security in modern ICs. PUFs are hardware designs that exploit the randomness in silicon manufacturing processes to create IC-specific signatures for silicon authentication. While prior PUF designs have been largely digital, in this work we propose a novel PUF design based on transfer function variability of an analog push-pull amplifier under process variations. A differential amplifier architecture is proposed with digital interfaces to allow the PUF to be used in digital as well as mixed-signal SoCs. A key innovation is digital stimulus engineering for the analog amplifier that allows 2X improvements in the uniqueness of IC signatures generated over arbiter-based digital PUF architectures, while maintaining high signature reliability over +/- 10 % voltage and -20 to 120 degree Celsius temperature variation. The proposed PUF is also resistive to model building attacks as the internal analog operation of the PUF is difficult to reverse-engineer due to the continuum of internal states involved. We show the benefits of the proposed PUF through comparison with a traditional arbiter-based digital PUF using simulation experiments.","PeriodicalId":256879,"journal":{"name":"2015 IEEE 24th Asian Test Symposium (ATS)","volume":"176 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Challenge Engineering and Design of Analog Push Pull Amplifier Based Physically Unclonable Function for Hardware Security\",\"authors\":\"Sabyasachi Deyati, B. Muldrey, A. Singh, A. Chatterjee\",\"doi\":\"10.1109/ATS.2015.29\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In the recent past, Physically Unclonable Functions (PUFs) have been proposed as a way of implementing security in modern ICs. PUFs are hardware designs that exploit the randomness in silicon manufacturing processes to create IC-specific signatures for silicon authentication. While prior PUF designs have been largely digital, in this work we propose a novel PUF design based on transfer function variability of an analog push-pull amplifier under process variations. A differential amplifier architecture is proposed with digital interfaces to allow the PUF to be used in digital as well as mixed-signal SoCs. A key innovation is digital stimulus engineering for the analog amplifier that allows 2X improvements in the uniqueness of IC signatures generated over arbiter-based digital PUF architectures, while maintaining high signature reliability over +/- 10 % voltage and -20 to 120 degree Celsius temperature variation. The proposed PUF is also resistive to model building attacks as the internal analog operation of the PUF is difficult to reverse-engineer due to the continuum of internal states involved. We show the benefits of the proposed PUF through comparison with a traditional arbiter-based digital PUF using simulation experiments.\",\"PeriodicalId\":256879,\"journal\":{\"name\":\"2015 IEEE 24th Asian Test Symposium (ATS)\",\"volume\":\"176 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-11-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE 24th Asian Test Symposium (ATS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.2015.29\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 24th Asian Test Symposium (ATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2015.29","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Challenge Engineering and Design of Analog Push Pull Amplifier Based Physically Unclonable Function for Hardware Security
In the recent past, Physically Unclonable Functions (PUFs) have been proposed as a way of implementing security in modern ICs. PUFs are hardware designs that exploit the randomness in silicon manufacturing processes to create IC-specific signatures for silicon authentication. While prior PUF designs have been largely digital, in this work we propose a novel PUF design based on transfer function variability of an analog push-pull amplifier under process variations. A differential amplifier architecture is proposed with digital interfaces to allow the PUF to be used in digital as well as mixed-signal SoCs. A key innovation is digital stimulus engineering for the analog amplifier that allows 2X improvements in the uniqueness of IC signatures generated over arbiter-based digital PUF architectures, while maintaining high signature reliability over +/- 10 % voltage and -20 to 120 degree Celsius temperature variation. The proposed PUF is also resistive to model building attacks as the internal analog operation of the PUF is difficult to reverse-engineer due to the continuum of internal states involved. We show the benefits of the proposed PUF through comparison with a traditional arbiter-based digital PUF using simulation experiments.