低成本AM/AM和AM/PM失真测量使用失真幅度转换

Shreyas Sen, S. Devarakond, A. Chatterjee
{"title":"低成本AM/AM和AM/PM失真测量使用失真幅度转换","authors":"Shreyas Sen, S. Devarakond, A. Chatterjee","doi":"10.1109/TEST.2009.5355531","DOIUrl":null,"url":null,"abstract":"Amplitude-to-amplitude (AM-AM) and amplitude-to-phase (AM-PM) distortion are two significant effects in power amplifiers at high output power levels. Traditional measurement of amplitude and phase distortion in RF power amplifiers requires the use of expensive vector network analyzers (VNAs). This paper proposes a low cost and accurate test methodology for AM-AM and AM-PM measurement using distortion-to-amplitude conversion using simple load board test circuitry along with the use of hardware and software based difference generation and peak detection mechanisms. It is seen that both distortion effects can be measured with high accuracy while allowing significant reduction in test cost.","PeriodicalId":419063,"journal":{"name":"2009 International Test Conference","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Low cost AM/AM and AM/PM distortion measurement using distortion-to-amplitude transformations\",\"authors\":\"Shreyas Sen, S. Devarakond, A. Chatterjee\",\"doi\":\"10.1109/TEST.2009.5355531\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Amplitude-to-amplitude (AM-AM) and amplitude-to-phase (AM-PM) distortion are two significant effects in power amplifiers at high output power levels. Traditional measurement of amplitude and phase distortion in RF power amplifiers requires the use of expensive vector network analyzers (VNAs). This paper proposes a low cost and accurate test methodology for AM-AM and AM-PM measurement using distortion-to-amplitude conversion using simple load board test circuitry along with the use of hardware and software based difference generation and peak detection mechanisms. It is seen that both distortion effects can be measured with high accuracy while allowing significant reduction in test cost.\",\"PeriodicalId\":419063,\"journal\":{\"name\":\"2009 International Test Conference\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-12-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2009.5355531\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2009.5355531","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11

摘要

幅相失真(AM-AM)和幅相失真(AM-PM)是影响功率放大器高输出功率的两个重要因素。传统的射频功率放大器幅度和相位畸变测量需要使用昂贵的矢量网络分析仪(vna)。本文提出了一种低成本和准确的测试方法,用于AM-AM和AM-PM测量,使用简单的负载板测试电路以及使用基于硬件和软件的差分产生和峰值检测机制。可以看出,这两种畸变效应都可以高精度地测量,同时大大降低了测试成本。
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Low cost AM/AM and AM/PM distortion measurement using distortion-to-amplitude transformations
Amplitude-to-amplitude (AM-AM) and amplitude-to-phase (AM-PM) distortion are two significant effects in power amplifiers at high output power levels. Traditional measurement of amplitude and phase distortion in RF power amplifiers requires the use of expensive vector network analyzers (VNAs). This paper proposes a low cost and accurate test methodology for AM-AM and AM-PM measurement using distortion-to-amplitude conversion using simple load board test circuitry along with the use of hardware and software based difference generation and peak detection mechanisms. It is seen that both distortion effects can be measured with high accuracy while allowing significant reduction in test cost.
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