{"title":"VLSI电路漂移可靠性优化的通用软件系统","authors":"Min Huang, M. Styblinski","doi":"10.1109/EURDAC.1992.246325","DOIUrl":null,"url":null,"abstract":"A generic software system called GOSSIPDR (generic optimization system for statistical improvement of performance) to perform DR (drift reliability) analysis and optimization is presented. This system was developed based on new DR analysis and optimization methodologies. Several useful system features and functions are described. Applications in VLSI circuit design are given, in which degradations due to hot electron effects are considered.<<ETX>>","PeriodicalId":218056,"journal":{"name":"Proceedings EURO-DAC '92: European Design Automation Conference","volume":"620 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A generic software system for drift reliability optimization of VLSI circuits\",\"authors\":\"Min Huang, M. Styblinski\",\"doi\":\"10.1109/EURDAC.1992.246325\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A generic software system called GOSSIPDR (generic optimization system for statistical improvement of performance) to perform DR (drift reliability) analysis and optimization is presented. This system was developed based on new DR analysis and optimization methodologies. Several useful system features and functions are described. Applications in VLSI circuit design are given, in which degradations due to hot electron effects are considered.<<ETX>>\",\"PeriodicalId\":218056,\"journal\":{\"name\":\"Proceedings EURO-DAC '92: European Design Automation Conference\",\"volume\":\"620 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings EURO-DAC '92: European Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EURDAC.1992.246325\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings EURO-DAC '92: European Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EURDAC.1992.246325","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
提出了一种用于漂移可靠性分析和优化的通用软件系统——gossip pdr (generic optimization system for statistical improvement of performance)。该系统是基于新的DR分析和优化方法开发的。介绍了几个有用的系统特性和功能。给出了在超大规模集成电路设计中的应用，其中考虑了热电子效应引起的退化。
A generic software system for drift reliability optimization of VLSI circuits
A generic software system called GOSSIPDR (generic optimization system for statistical improvement of performance) to perform DR (drift reliability) analysis and optimization is presented. This system was developed based on new DR analysis and optimization methodologies. Several useful system features and functions are described. Applications in VLSI circuit design are given, in which degradations due to hot electron effects are considered.<>
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