用光频域反射法测量光谱和时间相位

C. Calò, B. Robillart, Y. Gottesman, A. Fall, F. Lamare, K. Merghem, Anthony Martinez, A. Ramdane, Badr-Eddine Bcnkelfat
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引用次数: 4

摘要

在本工作中,我们报告了OFDR的频谱和时间相位测量能力。通过检索商用光学滤波器Finisar Waveshaper 1000 S/X的相位响应,在C+L波段(1530-1625 nm)衰减和相位可编程,证明了光谱相位信息的精确表征。此外,我们证明了该技术对多普勒效应的高灵敏度,使OFDR能够用于表征光电元件的动态方面。
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Spectral and temporal phase measurement by optical frequency-domain reflectometry
In the present work, we report on the spectral and temporal phase measurement capabilities of OFDR. Precise characterization of spectral phase information is demonstrated by retrieving the phase response of a commercial optical filter, the Finisar Waveshaper 1000 S/X programmable in attenuation and phase over C+L band (1530-1625 nm). Additionally, we demonstrate the high sensitivity of the technique to Doppler effects, enabling the use of OFDR for the characterization of dynamical aspects of optoelectronic components.
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