{"title":"真空断路器中粒子感应弧后击穿","authors":"S. Rowe","doi":"10.1109/DEIV.2000.877239","DOIUrl":null,"url":null,"abstract":"Charging of macro-particles is shown to occur due to the positive ion flux, in the growing plasma sheath, during the post arc current phase. A theoretical investigation of the influence of these strongly charged macro-particles, on the breakdown of vacuum circuit breakers, is presented. The trajectories of these positively charged particles during the recovery voltage phase is studied. Field emission from the cathode due to these particles is studied. Finally, the trajectories of emitted electrons are studied and breakdown probabilities discussed. The model proposed, gives new insight into the statistical nature of post arc breakdown in vacuum circuit breakers and especially, late breakdowns.","PeriodicalId":429452,"journal":{"name":"Proceedings ISDEIV. 19th International Symposium on Discharges and Electrical Insulation in Vacuum (Cat. No.00CH37041)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Particle induced post arc breakdown in vacuum circuit breakers\",\"authors\":\"S. Rowe\",\"doi\":\"10.1109/DEIV.2000.877239\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Charging of macro-particles is shown to occur due to the positive ion flux, in the growing plasma sheath, during the post arc current phase. A theoretical investigation of the influence of these strongly charged macro-particles, on the breakdown of vacuum circuit breakers, is presented. The trajectories of these positively charged particles during the recovery voltage phase is studied. Field emission from the cathode due to these particles is studied. Finally, the trajectories of emitted electrons are studied and breakdown probabilities discussed. The model proposed, gives new insight into the statistical nature of post arc breakdown in vacuum circuit breakers and especially, late breakdowns.\",\"PeriodicalId\":429452,\"journal\":{\"name\":\"Proceedings ISDEIV. 19th International Symposium on Discharges and Electrical Insulation in Vacuum (Cat. No.00CH37041)\",\"volume\":\"48 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-09-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings ISDEIV. 19th International Symposium on Discharges and Electrical Insulation in Vacuum (Cat. No.00CH37041)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DEIV.2000.877239\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings ISDEIV. 19th International Symposium on Discharges and Electrical Insulation in Vacuum (Cat. No.00CH37041)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DEIV.2000.877239","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Particle induced post arc breakdown in vacuum circuit breakers
Charging of macro-particles is shown to occur due to the positive ion flux, in the growing plasma sheath, during the post arc current phase. A theoretical investigation of the influence of these strongly charged macro-particles, on the breakdown of vacuum circuit breakers, is presented. The trajectories of these positively charged particles during the recovery voltage phase is studied. Field emission from the cathode due to these particles is studied. Finally, the trajectories of emitted electrons are studied and breakdown probabilities discussed. The model proposed, gives new insight into the statistical nature of post arc breakdown in vacuum circuit breakers and especially, late breakdowns.