电镀镍衬底的垂直结构Ni/n-GaN肖特基二极管

Shui-Jinn Wang, Shun-Cheng Chang, K. Uang, B. Liou
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引用次数: 2

摘要

在过去的十年中,大多数GaN垂直器件的应用都是通过晶圆键合或直接外延在SiC或GaN晶圆上进行的。然而,前者由于高温高压的键合过程,通常在GaN与键合晶片之间产生较大的应变,而后者由于使用SiC或GaN衬底而不具有成本效益。本文提出了一种新型的垂直结构的Ni/n-GaN肖特基势垒二极管(SBD),其金属衬底采用镀镍和激光提升(LLO)工艺,并报道了其电学特性
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Vertical-structured Ni/n-GaN schottky diode with electroplating nickel substrate
For the past decade, most of vertical device applications of GaN were processed by either wafer bonding or direct epitaxy on SiC or GaN wafer. However, the former usually suffers from large strain between GaN and bonding wafer because the high temperature and high pressure bonding process, and the later is not cost effective because of using SiC or GaN substrate. In this work, a novel vertical structure of Ni/n-GaN Schottky barrier diode (SBD) with metallic substrate employing nickel electroplating and laser lift-off (LLO) processes is proposed and its electrical characteristics is reported
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