{"title":"增强从具有亚波长尺寸特征的纹理表面提取光线:超越光线追踪近似","authors":"S. Riyopoulos","doi":"10.1109/NUSOD.2007.4349006","DOIUrl":null,"url":null,"abstract":"Greatly enhanced radiation extraction has been observed through randomly textured interfaces with feature sizes comparable to the wavelength, where ray tracing approaches fail. A numerical tool is introduced based on spectral decomposition and supercritical scattering. A quasi- periodic interface destroys the k|| invariance, introducing wave-numbers shifted by structure period harmonics, and allows transmission for supercritical incidence. Converting the interface boundary conditions into effective current source terms yield integral formulas for the transmitted fraction including quasi-periodic, sub-wavelength surface features with random variation of the feature size and period.","PeriodicalId":255219,"journal":{"name":"2007 International Conference on Numerical Simulation of Optoelectronic Devices","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Enhanced light extraction from textured surfaces with sub-wavelength size features: beyond the ray tracing approximation\",\"authors\":\"S. Riyopoulos\",\"doi\":\"10.1109/NUSOD.2007.4349006\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Greatly enhanced radiation extraction has been observed through randomly textured interfaces with feature sizes comparable to the wavelength, where ray tracing approaches fail. A numerical tool is introduced based on spectral decomposition and supercritical scattering. A quasi- periodic interface destroys the k|| invariance, introducing wave-numbers shifted by structure period harmonics, and allows transmission for supercritical incidence. Converting the interface boundary conditions into effective current source terms yield integral formulas for the transmitted fraction including quasi-periodic, sub-wavelength surface features with random variation of the feature size and period.\",\"PeriodicalId\":255219,\"journal\":{\"name\":\"2007 International Conference on Numerical Simulation of Optoelectronic Devices\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-10-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 International Conference on Numerical Simulation of Optoelectronic Devices\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NUSOD.2007.4349006\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 International Conference on Numerical Simulation of Optoelectronic Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NUSOD.2007.4349006","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Enhanced light extraction from textured surfaces with sub-wavelength size features: beyond the ray tracing approximation
Greatly enhanced radiation extraction has been observed through randomly textured interfaces with feature sizes comparable to the wavelength, where ray tracing approaches fail. A numerical tool is introduced based on spectral decomposition and supercritical scattering. A quasi- periodic interface destroys the k|| invariance, introducing wave-numbers shifted by structure period harmonics, and allows transmission for supercritical incidence. Converting the interface boundary conditions into effective current source terms yield integral formulas for the transmitted fraction including quasi-periodic, sub-wavelength surface features with random variation of the feature size and period.