{"title":"自动集成片上可测试电路","authors":"N. Ito","doi":"10.1109/DAC.1990.114912","DOIUrl":null,"url":null,"abstract":"A system which automatically incorporates testability circuits into ECL chips is presented. Three types of circuits are incorporated: (1) a random access scan circuit, (2) a clock suppression circuit for delay fault testing, and (3) a pin scan-out circuit for chip I/O pin observation in board testing. Fanout destinations of each gate in the testability circuits are localized on a chip to keep the logical net length within the limit. This system was used to develop the new Fujitsu VP-2000 supercomputer.<<ETX>>","PeriodicalId":118552,"journal":{"name":"27th ACM/IEEE Design Automation Conference","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Automatic incorporation of on-chip testability circuits\",\"authors\":\"N. Ito\",\"doi\":\"10.1109/DAC.1990.114912\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A system which automatically incorporates testability circuits into ECL chips is presented. Three types of circuits are incorporated: (1) a random access scan circuit, (2) a clock suppression circuit for delay fault testing, and (3) a pin scan-out circuit for chip I/O pin observation in board testing. Fanout destinations of each gate in the testability circuits are localized on a chip to keep the logical net length within the limit. This system was used to develop the new Fujitsu VP-2000 supercomputer.<<ETX>>\",\"PeriodicalId\":118552,\"journal\":{\"name\":\"27th ACM/IEEE Design Automation Conference\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-06-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"27th ACM/IEEE Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DAC.1990.114912\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"27th ACM/IEEE Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DAC.1990.114912","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Automatic incorporation of on-chip testability circuits
A system which automatically incorporates testability circuits into ECL chips is presented. Three types of circuits are incorporated: (1) a random access scan circuit, (2) a clock suppression circuit for delay fault testing, and (3) a pin scan-out circuit for chip I/O pin observation in board testing. Fanout destinations of each gate in the testability circuits are localized on a chip to keep the logical net length within the limit. This system was used to develop the new Fujitsu VP-2000 supercomputer.<>
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