智能工厂的智能焊线工艺

I. Qin, Aashish Shah, B. Milton, G. Schulze, A. Chang, N. Wong
{"title":"智能工厂的智能焊线工艺","authors":"I. Qin, Aashish Shah, B. Milton, G. Schulze, A. Chang, N. Wong","doi":"10.1109/EPTC.2018.8654365","DOIUrl":null,"url":null,"abstract":"More and more semiconductor manufacturers are adopting “smart” technology to improve throughput, yield and factory efficiency. In this paper, we examine how smart technology addresses two big challenges of wire bonding including fine pitch Cu first bond process and multi-tier looping. Fine pitch Cu first bond process has smaller process window and is harder to optimize than the traditional Au wire process. Through extensive research and development, a smart response based process was developed to provide wider process windows and easier adjustments. The main input to this process is desired ball diameter. Based on the desired ball diameter and other device information, optimal bonding parameters are calculated. This new smart 1st bond process is compared to traditional process to demonstrate fine pitch Cu wire bonding capability. In addition to the response based process with automatic parameter calculation, real time control is added for process monitoring and closed loop control. A new feature called Deformation Control is developed to control ball deformation using real time bonder signal feedback. Test results show that the ball size range and shear Cpk is significantly improved using this feature.The second area where major improvements have been made using smart wire bonding technology is multi-tier looping. For multi-tier devices, multiple tiers of loops with different loop heights and wire lengths need to be optimized to ensure high yield wire bonding production. A 1000 +I /O multi-tier package often requires more than 100 looping parameter groups. This results in months of looping development before a new device can be run in production. A new smart looping process was developed to address these challenges. The new looping process contains a 3D Loop Design software (3D AutoOLP) which is an offline loop design tool, and a wire loop model (ProCu Loop) that automatically calculates the looping motions to produce desired loop shapes. Four different real life applications were designed and tested with the new looping process and compared to traditional method. The average optimization time is reduced from 6 weeks to 1 week for these packages and there is a more than 50% reduction of the number of looping parameter groups. In addition, real time loop height monitor is developed to monitor loop height during production.","PeriodicalId":360239,"journal":{"name":"2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Smart Wire Bonding Processes for Smart Factories\",\"authors\":\"I. Qin, Aashish Shah, B. Milton, G. Schulze, A. Chang, N. Wong\",\"doi\":\"10.1109/EPTC.2018.8654365\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"More and more semiconductor manufacturers are adopting “smart” technology to improve throughput, yield and factory efficiency. In this paper, we examine how smart technology addresses two big challenges of wire bonding including fine pitch Cu first bond process and multi-tier looping. Fine pitch Cu first bond process has smaller process window and is harder to optimize than the traditional Au wire process. Through extensive research and development, a smart response based process was developed to provide wider process windows and easier adjustments. The main input to this process is desired ball diameter. Based on the desired ball diameter and other device information, optimal bonding parameters are calculated. This new smart 1st bond process is compared to traditional process to demonstrate fine pitch Cu wire bonding capability. In addition to the response based process with automatic parameter calculation, real time control is added for process monitoring and closed loop control. A new feature called Deformation Control is developed to control ball deformation using real time bonder signal feedback. Test results show that the ball size range and shear Cpk is significantly improved using this feature.The second area where major improvements have been made using smart wire bonding technology is multi-tier looping. For multi-tier devices, multiple tiers of loops with different loop heights and wire lengths need to be optimized to ensure high yield wire bonding production. A 1000 +I /O multi-tier package often requires more than 100 looping parameter groups. This results in months of looping development before a new device can be run in production. A new smart looping process was developed to address these challenges. The new looping process contains a 3D Loop Design software (3D AutoOLP) which is an offline loop design tool, and a wire loop model (ProCu Loop) that automatically calculates the looping motions to produce desired loop shapes. Four different real life applications were designed and tested with the new looping process and compared to traditional method. The average optimization time is reduced from 6 weeks to 1 week for these packages and there is a more than 50% reduction of the number of looping parameter groups. In addition, real time loop height monitor is developed to monitor loop height during production.\",\"PeriodicalId\":360239,\"journal\":{\"name\":\"2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPTC.2018.8654365\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2018.8654365","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

越来越多的半导体制造商正在采用“智能”技术来提高产量、良率和工厂效率。在本文中,我们研究了智能技术如何解决线键合的两大挑战,包括细间距铜第一键合工艺和多层环。与传统的金丝工艺相比,细间距铜一键工艺具有更小的工艺窗口和更难优化的特点。通过广泛的研究和开发,开发了基于智能响应的流程,以提供更宽的流程窗口和更容易的调整。这个过程的主要输入是期望的球直径。根据期望的球直径和其他器件信息,计算出最佳的键合参数。这种新的智能第一键合工艺与传统工艺进行了比较,以展示细间距铜丝键合能力。在基于响应的过程自动参数计算的基础上,增加了过程监控和闭环控制的实时控制。一种称为变形控制的新功能是利用实时键合信号反馈来控制球的变形。试验结果表明,该特性显著提高了球粒度范围和剪切Cpk。使用智能线键合技术取得重大改进的第二个领域是多层环路。对于多层器件,需要优化具有不同环路高度和线长的多层环路,以确保高成品率的线键合生产。一个1000 +I /O的多层包通常需要100多个循环参数组。这导致在新设备可以在生产环境中运行之前需要进行数月的循环开发。为了应对这些挑战,开发了一种新的智能循环过程。新的环路过程包含一个3D环路设计软件(3D AutoOLP),这是一个离线环路设计工具,以及一个自动计算环路运动以产生所需环路形状的线圈模型(ProCu Loop)。设计并测试了四种不同的实际应用,并与传统方法进行了比较。这些包的平均优化时间从6周减少到1周,循环参数组的数量减少了50%以上。此外,还开发了实时回路高度监视器,用于监控生产过程中的回路高度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Smart Wire Bonding Processes for Smart Factories
More and more semiconductor manufacturers are adopting “smart” technology to improve throughput, yield and factory efficiency. In this paper, we examine how smart technology addresses two big challenges of wire bonding including fine pitch Cu first bond process and multi-tier looping. Fine pitch Cu first bond process has smaller process window and is harder to optimize than the traditional Au wire process. Through extensive research and development, a smart response based process was developed to provide wider process windows and easier adjustments. The main input to this process is desired ball diameter. Based on the desired ball diameter and other device information, optimal bonding parameters are calculated. This new smart 1st bond process is compared to traditional process to demonstrate fine pitch Cu wire bonding capability. In addition to the response based process with automatic parameter calculation, real time control is added for process monitoring and closed loop control. A new feature called Deformation Control is developed to control ball deformation using real time bonder signal feedback. Test results show that the ball size range and shear Cpk is significantly improved using this feature.The second area where major improvements have been made using smart wire bonding technology is multi-tier looping. For multi-tier devices, multiple tiers of loops with different loop heights and wire lengths need to be optimized to ensure high yield wire bonding production. A 1000 +I /O multi-tier package often requires more than 100 looping parameter groups. This results in months of looping development before a new device can be run in production. A new smart looping process was developed to address these challenges. The new looping process contains a 3D Loop Design software (3D AutoOLP) which is an offline loop design tool, and a wire loop model (ProCu Loop) that automatically calculates the looping motions to produce desired loop shapes. Four different real life applications were designed and tested with the new looping process and compared to traditional method. The average optimization time is reduced from 6 weeks to 1 week for these packages and there is a more than 50% reduction of the number of looping parameter groups. In addition, real time loop height monitor is developed to monitor loop height during production.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Package Integrity and Reliability Effects of Mold Compound Chemistry for Power Device Application Kirkendall Voids Improvement in Thin Small No Lead Package Implementation of High-Temperature Pressure Sensor Package and Characterization up to 500°C EPIC Via Last on SOI Wafer Integration Challenges Laser hybrid integration on silicon photonic integrated circuits with reflected grating
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1