包括电镀在内的晶圆精加工技术的进展

K. Lowry, C. VanHorn, G. Shawhan
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摘要

只提供摘要形式。作为气相沉积技术的替代方案,在晶圆精加工应用中,电镀工艺的使用势头正在增加,这不仅发生在凹凸应用中,而且还可能取代集成电路本身的顶层导体。半导体行业对电镀技术的接受取决于其满足关键技术要求的能力,同时有效地解决拥有成本问题。这对于大面积格式的生产来说尤其如此,因为实施所需的设备投资需要在所有领域的工艺成本方面进行重大改进。一般来说,电镀在这两个方面都有优势。本文讨论了新的自动化,盒式到盒式电镀设备,这是专门为晶圆加工应用而开发的。该演讲将详细介绍该系统的自动化以及包括200毫米晶圆在内的大批量生产的预期吞吐能力。将讨论额外的拥有成本问题,包括系统生命周期内的固定成本估算、与系统年度运行相关的可变成本估算、系统利用率和停机时间估算以及与潜在产量损失相关的过程一致性。在此设备上进行的200毫米晶圆分布研究的结果也将被介绍。特别是,电镀铜,其主要应用是作为导体替代气相沉积铝在集成电路本身将被讨论。此外,还将讨论铅锡,因为它与倒装芯片应用的晶圆碰撞有关。信息也将包括在黄金碰撞TAB应用程序。
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Advancements in wafer finishing manufacturing technology involving plating
Summary form only given. Momentum for the increased use of plating processes in wafer finishing applications, as an alternative to vapor deposition technology, is occurring in both bump applications and also as a potential replacement to the top layer conductors of the integrated circuit itself. The acceptance of plating technology in the semiconductor industry is predicated upon its ability to satisfy both key technical requirements and, at the same time, effectively address cost of ownership issues. This is especially true for larger area format production where the facility investment required for implementation necessitates significant improvement in all areas of process cost. In general, electroplating offers advantages in both of these areas. This paper discusses new automated, cassette-to-cassette electroplating equipment that has been developed specifically for wafer finishing applications. Included in the presentation will be details of the automation of the system and the expected throughput capabilities for high volume production including 200 mm wafers. Additional cost of ownership issues will be discussed including fixed cost estimates over the life of the system, variable cost estimates relating to the annual operation of the system, system utilization and downtime estimates and process consistency as it relates to potential yield losses. Results of distribution studies on 200 mm wafers carried out in this equipment will also be presented. In particular, electroplated copper, which has its primary application as a conductor replacement for vapor deposited aluminum on the IC itself will be discussed. In addition, lead-tin will also be discussed as it relates to wafer bumping for flip-chip applications. Information will also be included on gold bumping for TAB applications.
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