单片IDDQ监视器

Proceedings European Design and Test Conference. ED & TC 97 Pub Date : 1997-03-17 DOI:10.1109/EDTC.1997.582442

M. Svajda, B. Straka, H. Manhaeve

{"title":"单片IDDQ监视器","authors":"M. Svajda, B. Straka, H. Manhaeve","doi":"10.1109/EDTC.1997.582442","DOIUrl":null,"url":null,"abstract":"An integrated off-chip I/sub DDQ/ measuring unit (IOCIMU) is described in this paper. The semi-digital current monitor is designed for the use with standard automatic test equipment (ATE). Simulations of the monolithic monitor implemented in a 2-/spl mu/m BiCMOS technology show an accuracy better than 1% for currents in the range from 0 to 1 mA and a test rate up to 10 kHz.","PeriodicalId":297301,"journal":{"name":"Proceedings European Design and Test Conference. ED & TC 97","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A monolithic off-chip IDDQ monitor\",\"authors\":\"M. Svajda, B. Straka, H. Manhaeve\",\"doi\":\"10.1109/EDTC.1997.582442\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An integrated off-chip I/sub DDQ/ measuring unit (IOCIMU) is described in this paper. The semi-digital current monitor is designed for the use with standard automatic test equipment (ATE). Simulations of the monolithic monitor implemented in a 2-/spl mu/m BiCMOS technology show an accuracy better than 1% for currents in the range from 0 to 1 mA and a test rate up to 10 kHz.\",\"PeriodicalId\":297301,\"journal\":{\"name\":\"Proceedings European Design and Test Conference. ED & TC 97\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-03-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings European Design and Test Conference. ED & TC 97\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDTC.1997.582442\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings European Design and Test Conference. ED & TC 97","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDTC.1997.582442","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

本文介绍了一种集成的片外I/sub DDQ/测量单元(IOCIMU)。半数字电流监测仪是为与标准自动测试设备(ATE)配合使用而设计的。对采用2-/spl mu/m BiCMOS技术实现的单片监视器的仿真表明，在电流范围为0至1 mA的情况下，准确度优于1%，测试速率高达10 kHz。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

A monolithic off-chip IDDQ monitor

An integrated off-chip I/sub DDQ/ measuring unit (IOCIMU) is described in this paper. The semi-digital current monitor is designed for the use with standard automatic test equipment (ATE). Simulations of the monolithic monitor implemented in a 2-/spl mu/m BiCMOS technology show an accuracy better than 1% for currents in the range from 0 to 1 mA and a test rate up to 10 kHz.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Proceedings European Design and Test Conference. ED & TC 97

自引率

0.00%

发文量

期刊最新文献

A real-time smart sensor system for visual motion estimation A gridless multi-layer router for standard cell circuits using CTM cells Design and implementation of a coprocessor for cryptography applications Compact structural test generation for analog macros Multi-layer chip-level global routing using an efficient graph-based Steiner tree heuristic