A. Ruospo, Lucas Matana Luza, A. Bosio, Marcello Traiola, L. Dilillo, Ernesto Sánchez
{"title":"深度神经网络可靠性评估中故障注入方法的优缺点","authors":"A. Ruospo, Lucas Matana Luza, A. Bosio, Marcello Traiola, L. Dilillo, Ernesto Sánchez","doi":"10.1109/LATS53581.2021.9651807","DOIUrl":null,"url":null,"abstract":"In the last years, the adoption of Artificial Neural Networks (ANNs) in safety-critical applications has required an in-depth study of their reliability. For this reason, the research community has shown a growing interest in understanding the robustness of artificial computing models to hardware faults. Indeed, several recent studies have demonstrated that hardware faults induced by an external perturbation or due to silicon wear out and aging effects can significantly impact the ANN inference leading to wrong predictions. This work classifies and analyses the principal reliability assessment methodologies based on Fault Injection at different abstraction levels and with different procedures. Some of the most representative academic and industrial works proposed in the literature are described and the principal advantages, and drawbacks are highlighted.","PeriodicalId":404536,"journal":{"name":"2021 IEEE 22nd Latin American Test Symposium (LATS)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks\",\"authors\":\"A. Ruospo, Lucas Matana Luza, A. Bosio, Marcello Traiola, L. Dilillo, Ernesto Sánchez\",\"doi\":\"10.1109/LATS53581.2021.9651807\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In the last years, the adoption of Artificial Neural Networks (ANNs) in safety-critical applications has required an in-depth study of their reliability. For this reason, the research community has shown a growing interest in understanding the robustness of artificial computing models to hardware faults. Indeed, several recent studies have demonstrated that hardware faults induced by an external perturbation or due to silicon wear out and aging effects can significantly impact the ANN inference leading to wrong predictions. This work classifies and analyses the principal reliability assessment methodologies based on Fault Injection at different abstraction levels and with different procedures. Some of the most representative academic and industrial works proposed in the literature are described and the principal advantages, and drawbacks are highlighted.\",\"PeriodicalId\":404536,\"journal\":{\"name\":\"2021 IEEE 22nd Latin American Test Symposium (LATS)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE 22nd Latin American Test Symposium (LATS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/LATS53581.2021.9651807\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 22nd Latin American Test Symposium (LATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LATS53581.2021.9651807","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks
In the last years, the adoption of Artificial Neural Networks (ANNs) in safety-critical applications has required an in-depth study of their reliability. For this reason, the research community has shown a growing interest in understanding the robustness of artificial computing models to hardware faults. Indeed, several recent studies have demonstrated that hardware faults induced by an external perturbation or due to silicon wear out and aging effects can significantly impact the ANN inference leading to wrong predictions. This work classifies and analyses the principal reliability assessment methodologies based on Fault Injection at different abstraction levels and with different procedures. Some of the most representative academic and industrial works proposed in the literature are described and the principal advantages, and drawbacks are highlighted.