{"title":"一个自校准12b12 µs CMOS ADC","authors":"Hae-Sung Lee, D. Hodges, P. Gray","doi":"10.1109/ISSCC.1984.1156622","DOIUrl":null,"url":null,"abstract":"Linearity errors of a weighted-capacitor ADC have been corrected, using a simple digital algorithm. A CMOS comparator which resolves 50μV in 500ns, allows this approach to yield a 12b accurate conversion in 22us. Chip area is under 7mm2.","PeriodicalId":260117,"journal":{"name":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"A self calibrating 12b 12µs CMOS ADC\",\"authors\":\"Hae-Sung Lee, D. Hodges, P. Gray\",\"doi\":\"10.1109/ISSCC.1984.1156622\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Linearity errors of a weighted-capacitor ADC have been corrected, using a simple digital algorithm. A CMOS comparator which resolves 50μV in 500ns, allows this approach to yield a 12b accurate conversion in 22us. Chip area is under 7mm2.\",\"PeriodicalId\":260117,\"journal\":{\"name\":\"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.1984.1156622\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1984.1156622","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Linearity errors of a weighted-capacitor ADC have been corrected, using a simple digital algorithm. A CMOS comparator which resolves 50μV in 500ns, allows this approach to yield a 12b accurate conversion in 22us. Chip area is under 7mm2.