{"title":"动态可编程逻辑阵列的串扰测试图生成","authors":"J. Liu, W. Jone, S.R. Das","doi":"10.1109/IMTC.2005.1604067","DOIUrl":null,"url":null,"abstract":"In modern deep sub-micron (DSM) circuits, signal crosstalk can arise between two long parallel wires. Dynamic programmable logic arrays (PLAs) may suffer crosstalk noises that will cause the circuit to malfunction due to charge loss. In this paper, based on the characteristics of dynamic PLA crosstalk noises, we present an automatic test pattern generation (ATPG) method to detect the maximum crosstalk noise for each product line. Experimental results obtained by simulating MCNC PLA benchmark circuits demonstrate the efficiency of the ATPG and method","PeriodicalId":244878,"journal":{"name":"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings","volume":"187 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Crosstalk Test Pattern Generation for Dynamic Programmable Logic Arrays\",\"authors\":\"J. Liu, W. Jone, S.R. Das\",\"doi\":\"10.1109/IMTC.2005.1604067\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In modern deep sub-micron (DSM) circuits, signal crosstalk can arise between two long parallel wires. Dynamic programmable logic arrays (PLAs) may suffer crosstalk noises that will cause the circuit to malfunction due to charge loss. In this paper, based on the characteristics of dynamic PLA crosstalk noises, we present an automatic test pattern generation (ATPG) method to detect the maximum crosstalk noise for each product line. Experimental results obtained by simulating MCNC PLA benchmark circuits demonstrate the efficiency of the ATPG and method\",\"PeriodicalId\":244878,\"journal\":{\"name\":\"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings\",\"volume\":\"187 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-05-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.2005.1604067\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.2005.1604067","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Crosstalk Test Pattern Generation for Dynamic Programmable Logic Arrays
In modern deep sub-micron (DSM) circuits, signal crosstalk can arise between two long parallel wires. Dynamic programmable logic arrays (PLAs) may suffer crosstalk noises that will cause the circuit to malfunction due to charge loss. In this paper, based on the characteristics of dynamic PLA crosstalk noises, we present an automatic test pattern generation (ATPG) method to detect the maximum crosstalk noise for each product line. Experimental results obtained by simulating MCNC PLA benchmark circuits demonstrate the efficiency of the ATPG and method
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