{"title":"片上网络的自适应高编码率软纠错方法","authors":"K. Dang, Xuan-Tu Tran","doi":"10.25073/2588-1086/VNUCSCE.218","DOIUrl":null,"url":null,"abstract":"The soft error rates per single-bit due to alpha particles in sub-micron technology is expectedly reducedas the feature size is shrinking. On the other hand, the complexity and density of integrated systems are accelerating which demand ecient soft error protection mechanisms, especially for on-chip communication. Using soft error protection method has to satisfy tight requirements for the area and energy consumption, therefore a low complexity and low redundancy coding method is necessary. In this work, we propose a method to enhance Parity Product Code (PPC) and provide adaptation methods for this code. First, PPC is improved as forward error correcting using transposable retransmissions. Then, to adapt with dierent error rates, an augmented algorithm for configuring PPC is introduced. The evaluation results show that the proposed mechanism has coding rates similar to Parity check’s and outperforms the original PPC.Keywords \nError Correction Code, Fault-Tolerance, Network-on-Chip. \nReferences \n[1] R. Baumann, Radiation-induced soft errors in advanced semiconductor technologies, IEEETransactions on Device and materials reliability. 5-3 (2005) 305–316. https://doi.org/10.1109/tdmr.2005.853449.[2] N. Seifert, B. Gill, K. Foley, P. Relangi, Multi-cell upset probabilities of 45nm high-k + metal gateSRAM devices in terrestrial and space environments, in: IEEE International Reliability Physics Symposium 2008, IEEE, AZ, USA, 2008, pp. 181–186.[3] S. Lee, I. Kim, S. Ha, C.-s. Yu, J. Noh, S. Pae, J. Park, Radiation-induced soft error rate analyses for 14 nmFinFET SRAM devices, in: 2015 IEEE International Reliability Physics Symposium (IRPS), IEEE, CA, USA, 2015, pp. 4B–1.[4] R. Hamming, Error detecting and error correcting codes, Bell Labs Tech. J. 29-2 (1950) 147–160. https://www.doi.org/10.1002/j.1538-7305.1950.tb00463.x.[5] M. Hsiao, A class of optimal minimum odd-weight-column SEC-DED codes, IBMJ. Res. Dev. 14-4 (1970) 395–401. https://www.doi.org/10.1147/rd.144.0395.[6] S. Mittal, M. Inukonda, A survey of techniques for improving error-resilience of dram, Journal ofSystems Architecture. 91-1 (2018) 11–40. https://www.doi.org/10.1016/j.sysarc.2018.09.004.[7] D. Bertozzi, et al., Error control schemes for on-chip communication links: the energy-reliabilitytradeo, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 24-6 (2005) 818–831. https://doi.org/10.1109/tcad.2005. 847907.[8] F. Chiaraluce, R. Garello, Extended Hamming product codes analytical performance evaluation for low errorrate applications, IEEE Transactions on Wireless Communications. 3-6 (2004) 2353–2361. https://doi. org/10.1109/twc.2004.837405.[9] R. Pyndiah, Near-optimum decoding of product codes: Block turbo codes, IEEE Transactions onCommunications. 46-8 (1998) 1003–1010. https://www.doi.org/10.1109/26.705396.[10] N. Magen, A. Kolodny, U. Weiser, N. Shamir, Interconnect-power dissipation in a microprocessor,in: Proceedings of the 2004 international workshop on System level interconnect prediction, ACM, Paris,France, 2004, pp. 7–13.[11] K. Dang, X. Tran, Parity-based ECC and Mechanism for Detecting and Correcting Soft Errors in On-ChipCommunication, in: Proceeding of 2018 IEEE 11th International Symposium on EmbeddedMulticore/Many-core Systems-on-Chip, IEEE, Hanoi, Vietnam, 2018, pp. 1–6.[12] L. Saiz-Adalid, et al., MCU tolerance in SRAMs through low-redundancy triple adjacent error correction, IEEE Transactions on VLSI Systems. 23-10 (2015) 2332–2336. https://www.doi.org/10.1109/tvlsi.2014.2357476.[13] W. Peterson, D. Brown, Cyclic codes for error detection, Proceedings of the IRE 49-1 (1961)228–235. https://www.doi.org/10.1109/jrproc.1961.287814.[14] S. Wicker, V. Bhargava, Reed-Solomon Codes and Their Applications, first ed., JohnWiley and Sons, NJ,USA, 1999.[15] I. Reed, X. Chen, Error-control coding for data networks, first ed., Springer Science and BusinessMedia, New York, 2012.[16] L. Peterson, B. Davie, Computer networks: a systems approach, fifth ed., Elsevier, New York, 2011.[17] K. Dang, et al., Soft-error resilient 3D Network-on-Chip router, in: 2015 IEEE 7thInternational Conference on Awareness Science and Technology (iCAST), China, 2015, pp. 84–90.[18] K. Dang, et al., A low-overhead soft–hard fault-tolerant architecture, design and managementscheme for reliable high-performance many-core 3D-NoC systems, The Journal of Supercomputing.73-6 (2017) 2705–2729. https://www.doi.org/10.1007/s11227-016-1951-0.[19] D. Ernst, et al., Razor: A low-power pipeline based on circuit-level timing speculation, in: The36th annual IEEE/ACM International Symposium on Microarchitecture, IEEE, CA, USA, 2003, pp. 10–20.[20] H. Mohammed, W. Flayyih, F. Rokhani, Tolerating permanent faults in the input port of the network onchip router, Journal of Low Power Electronics and Applications. 9-1 (2019) 1–11. https://www.doi.org/10.3390/jlpea9010011.[21] G. Hubert, L. Artola, D. Regis, Impact of scaling on the soft error sensitivity of bulk, FDSOI and FinFETtechnologies due to atmospheric radiation, Integration, the VLSI journal. 50 (2015) 39–47. https://www.doi.org/10.1016/j.vlsi.2015.01.003.[22] J.-s. Seo, et al., A 45nm cmos neuromorphic chip with a scalable architecture for learning in networks of spiking neurons, in: 2011 IEEE Custom Integrated Circuits Conference (CICC), IEEE, CA, USA, 2011, pp. 1–4.[23] NanGate Inc., Nangate Open Cell Library 45 nm. http://www.nangate.com, (accessed 16.06.16) (2016).","PeriodicalId":416488,"journal":{"name":"VNU Journal of Science: Computer Science and Communication Engineering","volume":"166 2","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"An Adaptive and High Coding Rate Soft Error Correction Method in Network-on-Chips\",\"authors\":\"K. Dang, Xuan-Tu Tran\",\"doi\":\"10.25073/2588-1086/VNUCSCE.218\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The soft error rates per single-bit due to alpha particles in sub-micron technology is expectedly reducedas the feature size is shrinking. On the other hand, the complexity and density of integrated systems are accelerating which demand ecient soft error protection mechanisms, especially for on-chip communication. Using soft error protection method has to satisfy tight requirements for the area and energy consumption, therefore a low complexity and low redundancy coding method is necessary. In this work, we propose a method to enhance Parity Product Code (PPC) and provide adaptation methods for this code. First, PPC is improved as forward error correcting using transposable retransmissions. Then, to adapt with dierent error rates, an augmented algorithm for configuring PPC is introduced. The evaluation results show that the proposed mechanism has coding rates similar to Parity check’s and outperforms the original PPC.Keywords \\nError Correction Code, Fault-Tolerance, Network-on-Chip. \\nReferences \\n[1] R. Baumann, Radiation-induced soft errors in advanced semiconductor technologies, IEEETransactions on Device and materials reliability. 5-3 (2005) 305–316. https://doi.org/10.1109/tdmr.2005.853449.[2] N. Seifert, B. Gill, K. Foley, P. Relangi, Multi-cell upset probabilities of 45nm high-k + metal gateSRAM devices in terrestrial and space environments, in: IEEE International Reliability Physics Symposium 2008, IEEE, AZ, USA, 2008, pp. 181–186.[3] S. Lee, I. Kim, S. Ha, C.-s. Yu, J. Noh, S. Pae, J. Park, Radiation-induced soft error rate analyses for 14 nmFinFET SRAM devices, in: 2015 IEEE International Reliability Physics Symposium (IRPS), IEEE, CA, USA, 2015, pp. 4B–1.[4] R. Hamming, Error detecting and error correcting codes, Bell Labs Tech. J. 29-2 (1950) 147–160. https://www.doi.org/10.1002/j.1538-7305.1950.tb00463.x.[5] M. Hsiao, A class of optimal minimum odd-weight-column SEC-DED codes, IBMJ. Res. Dev. 14-4 (1970) 395–401. https://www.doi.org/10.1147/rd.144.0395.[6] S. Mittal, M. Inukonda, A survey of techniques for improving error-resilience of dram, Journal ofSystems Architecture. 91-1 (2018) 11–40. https://www.doi.org/10.1016/j.sysarc.2018.09.004.[7] D. Bertozzi, et al., Error control schemes for on-chip communication links: the energy-reliabilitytradeo, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 24-6 (2005) 818–831. https://doi.org/10.1109/tcad.2005. 847907.[8] F. Chiaraluce, R. Garello, Extended Hamming product codes analytical performance evaluation for low errorrate applications, IEEE Transactions on Wireless Communications. 3-6 (2004) 2353–2361. https://doi. org/10.1109/twc.2004.837405.[9] R. Pyndiah, Near-optimum decoding of product codes: Block turbo codes, IEEE Transactions onCommunications. 46-8 (1998) 1003–1010. https://www.doi.org/10.1109/26.705396.[10] N. Magen, A. Kolodny, U. Weiser, N. Shamir, Interconnect-power dissipation in a microprocessor,in: Proceedings of the 2004 international workshop on System level interconnect prediction, ACM, Paris,France, 2004, pp. 7–13.[11] K. Dang, X. Tran, Parity-based ECC and Mechanism for Detecting and Correcting Soft Errors in On-ChipCommunication, in: Proceeding of 2018 IEEE 11th International Symposium on EmbeddedMulticore/Many-core Systems-on-Chip, IEEE, Hanoi, Vietnam, 2018, pp. 1–6.[12] L. Saiz-Adalid, et al., MCU tolerance in SRAMs through low-redundancy triple adjacent error correction, IEEE Transactions on VLSI Systems. 23-10 (2015) 2332–2336. https://www.doi.org/10.1109/tvlsi.2014.2357476.[13] W. Peterson, D. Brown, Cyclic codes for error detection, Proceedings of the IRE 49-1 (1961)228–235. https://www.doi.org/10.1109/jrproc.1961.287814.[14] S. Wicker, V. Bhargava, Reed-Solomon Codes and Their Applications, first ed., JohnWiley and Sons, NJ,USA, 1999.[15] I. Reed, X. Chen, Error-control coding for data networks, first ed., Springer Science and BusinessMedia, New York, 2012.[16] L. Peterson, B. Davie, Computer networks: a systems approach, fifth ed., Elsevier, New York, 2011.[17] K. Dang, et al., Soft-error resilient 3D Network-on-Chip router, in: 2015 IEEE 7thInternational Conference on Awareness Science and Technology (iCAST), China, 2015, pp. 84–90.[18] K. Dang, et al., A low-overhead soft–hard fault-tolerant architecture, design and managementscheme for reliable high-performance many-core 3D-NoC systems, The Journal of Supercomputing.73-6 (2017) 2705–2729. https://www.doi.org/10.1007/s11227-016-1951-0.[19] D. Ernst, et al., Razor: A low-power pipeline based on circuit-level timing speculation, in: The36th annual IEEE/ACM International Symposium on Microarchitecture, IEEE, CA, USA, 2003, pp. 10–20.[20] H. Mohammed, W. Flayyih, F. Rokhani, Tolerating permanent faults in the input port of the network onchip router, Journal of Low Power Electronics and Applications. 9-1 (2019) 1–11. https://www.doi.org/10.3390/jlpea9010011.[21] G. Hubert, L. Artola, D. Regis, Impact of scaling on the soft error sensitivity of bulk, FDSOI and FinFETtechnologies due to atmospheric radiation, Integration, the VLSI journal. 50 (2015) 39–47. https://www.doi.org/10.1016/j.vlsi.2015.01.003.[22] J.-s. Seo, et al., A 45nm cmos neuromorphic chip with a scalable architecture for learning in networks of spiking neurons, in: 2011 IEEE Custom Integrated Circuits Conference (CICC), IEEE, CA, USA, 2011, pp. 1–4.[23] NanGate Inc., Nangate Open Cell Library 45 nm. http://www.nangate.com, (accessed 16.06.16) (2016).\",\"PeriodicalId\":416488,\"journal\":{\"name\":\"VNU Journal of Science: Computer Science and Communication Engineering\",\"volume\":\"166 2\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-06-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"VNU Journal of Science: Computer Science and Communication Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.25073/2588-1086/VNUCSCE.218\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"VNU Journal of Science: Computer Science and Communication Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.25073/2588-1086/VNUCSCE.218","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
摘要
在亚微米技术中,由于α粒子导致的每比特软错误率有望随着特征尺寸的缩小而降低。另一方面,集成系统的复杂性和密度都在不断增加,这就需要有效的软错误保护机制,特别是在片上通信方面。采用软错误保护方法必须满足对面积和能耗的严格要求,因此需要一种低复杂度和低冗余的编码方法。在这项工作中,我们提出了一种增强奇偶产品码(PPC)的方法,并提供了该代码的自适应方法。首先,利用转座重传将PPC改进为前向纠错。然后,为了适应不同的错误率,引入了一种增强的PPC配置算法。评估结果表明,该机制具有与奇偶校验相似的编码速率,并且优于原始的PPC。关键词纠错码,容错,片上网络。参考文献[10]R. Baumann,先进半导体技术中辐射诱导的软误差,电子工程学报,器件与材料可靠性。5-3(2005) 305-316。https://doi.org/10.1109/tdmr.2005.853449.[2] N. Seifert, B. Gill, K. Foley, P. Relangi,地面和空间环境下45nm高k +金属栅极ram器件的多单元干扰概率,2008,IEEE国际可靠性物理研讨会,IEEE, AZ, USA, pp. 181-186李诗诗,金诗诗,夏诗诗,c -s。俞建军,刘建军,张建军,张建军,张建军,张建军,张建军,张建军,张建军,张建军,张建军,张建军,张建军,张建军,张建军,张建军,张建军R.汉明,错误检测和纠错码,贝尔实验室技术J. 29-2(1950) 147-160。https://www.doi.org/10.1002/j.1538-7305.1950.tb00463.x.[5]肖明,一类最优最小奇重列SEC-DED码,计算机学报。修订14-4(1970)395-401。https://www.doi.org/10.1147/rd.144.0395. b[6] S. Mittal, M. Inukonda,提高dram的错误恢复能力的技术综述,系统架构,91-1(2018)11-40。https://www.doi.org/10.1016/j.sysarc.2018.09.004.[7] D. Bertozzi, et al.,芯片上通信链路的错误控制方案:能源可靠性贸易[j],集成电路与系统计算机辅助设计,24-6(2005)818-831。https://doi.org/10.1109/tcad.2005。847907年。[8]李建军,李建军,李建军,基于扩展汉明产品码的低误码率分析性能评估,通信学报,3-6(2004):2353-2361。https://doi。org/10.1109/twc.2004.837405。[9]李彦宏,产品码的近最优解码:分组turbo码,IEEE通讯学报。46-8(1998) 1003-1010。https://www.doi.org/10.1109/26.705396.[10] N. Magen, a . Kolodny, U. Weiser, N. Shamir,微处理器的互连功耗,载于:2004年系统级互连预测国际研讨会论文集,ACM,法国巴黎,2004,pp. 7-13邓凯,陈新,基于奇偶校验的ECC与片上通信软错误检测与纠错机制,第11届嵌入式多核/多核系统片上国际学术研讨会论文集,2018,pp. 1-6李志强,李志强,基于低冗余三相邻纠错的sram容差,集成电路学报,23(2015):2332-2336。https://www.doi.org/10.1109/tvlsi.2014.2357476. b[13] W. Peterson, D. Brown,循环码的错误检测,电气工程学报49-1(1961)228-235。https://www.doi.org/10.1109/jrproc.1961.287814.[14] S. Wicker, V. Bhargava, Reed-Solomon密码及其应用,第一版,JohnWiley and Sons, NJ,美国,1999陈晓明,李志强,基于数据网络的错误控制编码,第1版,2010 .中文信息学报,2012L. Peterson, B. david,计算机网络:一个系统方法,第5版,爱思唯尔,纽约,2011邓凯等,软误差弹性三维片上网络路由器,2015年IEEE第七届感知科学与技术国际会议(iCAST),中国,2015,pp. 84-90邓凯,等。一种基于多核3D-NoC系统的低负载软硬容错架构设计与管理方案,计算机工程学报,36(3)(2017):2705-2729。https://www.doi.org/10.1007/s11227-016-1951-0.[19] D. Ernst, et ., Razor:基于电路级时序推测的低功耗管道,载于:第36届IEEE/ACM国际微架构研讨会,IEEE, CA, USA, 2003, pp. 10-20 .[20]张晓明,张晓明,张晓明。基于dsp的网络单片路由器故障控制方法研究,计算机应用学报,34(1)(2019)。https://www.doi.org/10.3390/jlpea9010011. b[21] G. Hubert, L. Artola, D。
An Adaptive and High Coding Rate Soft Error Correction Method in Network-on-Chips
The soft error rates per single-bit due to alpha particles in sub-micron technology is expectedly reducedas the feature size is shrinking. On the other hand, the complexity and density of integrated systems are accelerating which demand ecient soft error protection mechanisms, especially for on-chip communication. Using soft error protection method has to satisfy tight requirements for the area and energy consumption, therefore a low complexity and low redundancy coding method is necessary. In this work, we propose a method to enhance Parity Product Code (PPC) and provide adaptation methods for this code. First, PPC is improved as forward error correcting using transposable retransmissions. Then, to adapt with dierent error rates, an augmented algorithm for configuring PPC is introduced. The evaluation results show that the proposed mechanism has coding rates similar to Parity check’s and outperforms the original PPC.Keywords
Error Correction Code, Fault-Tolerance, Network-on-Chip.
References
[1] R. Baumann, Radiation-induced soft errors in advanced semiconductor technologies, IEEETransactions on Device and materials reliability. 5-3 (2005) 305–316. https://doi.org/10.1109/tdmr.2005.853449.[2] N. Seifert, B. Gill, K. Foley, P. Relangi, Multi-cell upset probabilities of 45nm high-k + metal gateSRAM devices in terrestrial and space environments, in: IEEE International Reliability Physics Symposium 2008, IEEE, AZ, USA, 2008, pp. 181–186.[3] S. Lee, I. Kim, S. Ha, C.-s. Yu, J. Noh, S. Pae, J. Park, Radiation-induced soft error rate analyses for 14 nmFinFET SRAM devices, in: 2015 IEEE International Reliability Physics Symposium (IRPS), IEEE, CA, USA, 2015, pp. 4B–1.[4] R. Hamming, Error detecting and error correcting codes, Bell Labs Tech. J. 29-2 (1950) 147–160. https://www.doi.org/10.1002/j.1538-7305.1950.tb00463.x.[5] M. Hsiao, A class of optimal minimum odd-weight-column SEC-DED codes, IBMJ. Res. Dev. 14-4 (1970) 395–401. https://www.doi.org/10.1147/rd.144.0395.[6] S. Mittal, M. Inukonda, A survey of techniques for improving error-resilience of dram, Journal ofSystems Architecture. 91-1 (2018) 11–40. https://www.doi.org/10.1016/j.sysarc.2018.09.004.[7] D. Bertozzi, et al., Error control schemes for on-chip communication links: the energy-reliabilitytradeo, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 24-6 (2005) 818–831. https://doi.org/10.1109/tcad.2005. 847907.[8] F. Chiaraluce, R. Garello, Extended Hamming product codes analytical performance evaluation for low errorrate applications, IEEE Transactions on Wireless Communications. 3-6 (2004) 2353–2361. https://doi. org/10.1109/twc.2004.837405.[9] R. Pyndiah, Near-optimum decoding of product codes: Block turbo codes, IEEE Transactions onCommunications. 46-8 (1998) 1003–1010. https://www.doi.org/10.1109/26.705396.[10] N. Magen, A. Kolodny, U. Weiser, N. Shamir, Interconnect-power dissipation in a microprocessor,in: Proceedings of the 2004 international workshop on System level interconnect prediction, ACM, Paris,France, 2004, pp. 7–13.[11] K. Dang, X. Tran, Parity-based ECC and Mechanism for Detecting and Correcting Soft Errors in On-ChipCommunication, in: Proceeding of 2018 IEEE 11th International Symposium on EmbeddedMulticore/Many-core Systems-on-Chip, IEEE, Hanoi, Vietnam, 2018, pp. 1–6.[12] L. Saiz-Adalid, et al., MCU tolerance in SRAMs through low-redundancy triple adjacent error correction, IEEE Transactions on VLSI Systems. 23-10 (2015) 2332–2336. https://www.doi.org/10.1109/tvlsi.2014.2357476.[13] W. Peterson, D. Brown, Cyclic codes for error detection, Proceedings of the IRE 49-1 (1961)228–235. https://www.doi.org/10.1109/jrproc.1961.287814.[14] S. Wicker, V. Bhargava, Reed-Solomon Codes and Their Applications, first ed., JohnWiley and Sons, NJ,USA, 1999.[15] I. Reed, X. Chen, Error-control coding for data networks, first ed., Springer Science and BusinessMedia, New York, 2012.[16] L. Peterson, B. Davie, Computer networks: a systems approach, fifth ed., Elsevier, New York, 2011.[17] K. Dang, et al., Soft-error resilient 3D Network-on-Chip router, in: 2015 IEEE 7thInternational Conference on Awareness Science and Technology (iCAST), China, 2015, pp. 84–90.[18] K. Dang, et al., A low-overhead soft–hard fault-tolerant architecture, design and managementscheme for reliable high-performance many-core 3D-NoC systems, The Journal of Supercomputing.73-6 (2017) 2705–2729. https://www.doi.org/10.1007/s11227-016-1951-0.[19] D. Ernst, et al., Razor: A low-power pipeline based on circuit-level timing speculation, in: The36th annual IEEE/ACM International Symposium on Microarchitecture, IEEE, CA, USA, 2003, pp. 10–20.[20] H. Mohammed, W. Flayyih, F. Rokhani, Tolerating permanent faults in the input port of the network onchip router, Journal of Low Power Electronics and Applications. 9-1 (2019) 1–11. https://www.doi.org/10.3390/jlpea9010011.[21] G. Hubert, L. Artola, D. Regis, Impact of scaling on the soft error sensitivity of bulk, FDSOI and FinFETtechnologies due to atmospheric radiation, Integration, the VLSI journal. 50 (2015) 39–47. https://www.doi.org/10.1016/j.vlsi.2015.01.003.[22] J.-s. Seo, et al., A 45nm cmos neuromorphic chip with a scalable architecture for learning in networks of spiking neurons, in: 2011 IEEE Custom Integrated Circuits Conference (CICC), IEEE, CA, USA, 2011, pp. 1–4.[23] NanGate Inc., Nangate Open Cell Library 45 nm. http://www.nangate.com, (accessed 16.06.16) (2016).