{"title":"伪随机检验的最坏情况分析","authors":"R. Marculescu","doi":"10.1109/VTEST.1993.313325","DOIUrl":null,"url":null,"abstract":"The testing problem of combinational circuits with pseudorandom patterns is investigated. Work by previous workers for single faults is extended to multiple faults situations; in addition, masking effects between disjoint/conjoint faults are considered. An analytical model based on Markov chains with any number of states is proposed for random/pseudorandom testing and relationships between test length and test confidence are developed. Evaluations of the model for double and triple faults are presented using well-known examples. The results presented in this paper are useful for BIST systems that use random/pseudorandom input patterns.<<ETX>>","PeriodicalId":283218,"journal":{"name":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","volume":"122 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Worst-case analysis for pseudorandom testing\",\"authors\":\"R. Marculescu\",\"doi\":\"10.1109/VTEST.1993.313325\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The testing problem of combinational circuits with pseudorandom patterns is investigated. Work by previous workers for single faults is extended to multiple faults situations; in addition, masking effects between disjoint/conjoint faults are considered. An analytical model based on Markov chains with any number of states is proposed for random/pseudorandom testing and relationships between test length and test confidence are developed. Evaluations of the model for double and triple faults are presented using well-known examples. The results presented in this paper are useful for BIST systems that use random/pseudorandom input patterns.<<ETX>>\",\"PeriodicalId\":283218,\"journal\":{\"name\":\"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium\",\"volume\":\"122 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-04-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.1993.313325\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1993.313325","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The testing problem of combinational circuits with pseudorandom patterns is investigated. Work by previous workers for single faults is extended to multiple faults situations; in addition, masking effects between disjoint/conjoint faults are considered. An analytical model based on Markov chains with any number of states is proposed for random/pseudorandom testing and relationships between test length and test confidence are developed. Evaluations of the model for double and triple faults are presented using well-known examples. The results presented in this paper are useful for BIST systems that use random/pseudorandom input patterns.<>
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