采用MIL-HDBK-217F和FIDES方法对紧凑型荧光灯电子电路进行可靠性分析

2019 IEEE XXVIII International Scientific Conference Electronics (ET) Pub Date : 2019-09-01 DOI:10.1109/ET.2019.8878592

P. Prodanov, D. Dankov

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引用次数: 3

摘要

电子元件的主要可靠性指标之一故障率的计算有几种指导性方法。通常，方法分为三组:乘性pi因子方法、加性pi因子方法和组合方法。本文比较了MIL-HDBK-217F和FIDES两种方法的结果和适用性，这两种方法在过去几年中已经确立了自己的基本方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Reliability Analysis of Electronic Circuit of Compact FIuorescent Lamp using Methods MIL-HDBK-217F and FIDES

There are several guiding methods for calculating one of the main reliability indicators-failure rate of electronic components. Generally, methods are divided into three groups: methods with multiplicative pi-factors, methods with additive pi-factors and combined methods. The present paper compares the results and applicability of two methods - MIL-HDBK-217F and FIDES, which over the last years have established themselves as basic methods.

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2019 IEEE XXVIII International Scientific Conference Electronics (ET)

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