一种考虑半导体器件充电电压的ESD控制方法

2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) Pub Date : 2016-09-01 DOI:10.1109/EOSESD.2016.7592543

N. Wakai, Kunihiro Maki, Futoshi Kaku, K. Hirose, T. Setoya

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引用次数: 0

摘要

我们考虑并提出了一种先进的用电压表监测器件充电电压的ESD控制方法。这一建议是基于对实际击穿报告的回顾和对半导体器件充电现象的监测方法的考虑。

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An ESD control method considering the semiconductor device charged voltage

We considered and proposed an advanced ESD control method with device charged voltage monitored by using voltmeter. This proposal is based on the review of actual breakdown reports and considerations of monitoring method with the investigation of semiconductor devices charge up phenomena.

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2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

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