M. Gourary, S. Rusakov, S. Ulyanov, M. Zharov, B. Mulvaney
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Time-domain non-Monte-Carlo method for noise simulation in CMOS imager sensors
This paper presents an approach for noise characterization of read-out circuits for CMOS image sensors in frames of transient noise analysis. It provides computation of the complete probabilistic characterization of such circuits. The method is efficient because no time-consuming convolution-like procedures are used. The flicker noise is naturally taken into account without additional computational efforts.
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