单片容错VLSI微处理器的设计考虑

A. Goode
{"title":"单片容错VLSI微处理器的设计考虑","authors":"A. Goode","doi":"10.1049/sm.1985.0016","DOIUrl":null,"url":null,"abstract":"A design approach is presented for a general-purpose VLSI fault tolerant microprocessor, with redundancy designed into the internal chip architecture. The design features are internal automatic state storage and rollback/retry mechanism and a microprogrammed ALU design. The reliability of the design is estimated using a system model of reliability behaviour, and is compared with that of other fault tolerant design strategies. Finally, the effect of the fault tolerance on processor performance is discussed.","PeriodicalId":246116,"journal":{"name":"Softw. Microsystems","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1985-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Design considerations for a single-chip fault tolerant VLSI microprocessor\",\"authors\":\"A. Goode\",\"doi\":\"10.1049/sm.1985.0016\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A design approach is presented for a general-purpose VLSI fault tolerant microprocessor, with redundancy designed into the internal chip architecture. The design features are internal automatic state storage and rollback/retry mechanism and a microprogrammed ALU design. The reliability of the design is estimated using a system model of reliability behaviour, and is compared with that of other fault tolerant design strategies. Finally, the effect of the fault tolerance on processor performance is discussed.\",\"PeriodicalId\":246116,\"journal\":{\"name\":\"Softw. Microsystems\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1985-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Softw. Microsystems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1049/sm.1985.0016\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Softw. Microsystems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1049/sm.1985.0016","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

提出了一种通用的超大规模集成电路容错微处理器的设计方法,并将冗余设计到芯片内部结构中。设计特点是内部自动状态存储和回滚/重试机制以及微编程ALU设计。利用可靠性行为的系统模型估计了设计的可靠性,并与其他容错设计策略进行了比较。最后,讨论了容错对处理器性能的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Design considerations for a single-chip fault tolerant VLSI microprocessor
A design approach is presented for a general-purpose VLSI fault tolerant microprocessor, with redundancy designed into the internal chip architecture. The design features are internal automatic state storage and rollback/retry mechanism and a microprogrammed ALU design. The reliability of the design is estimated using a system model of reliability behaviour, and is compared with that of other fault tolerant design strategies. Finally, the effect of the fault tolerance on processor performance is discussed.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Simulating hardware structures in occam Techniques for developing and testing microprocessor systems Design considerations for a single-chip fault tolerant VLSI microprocessor The development of fault tolerant computer systems using dual processing techniques Fault tolerance and self-checking techniques in microprocessor-based system design
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1