{"title":"辐射探头单片微波集成电路的测试","authors":"M. Hélier, J. Bolomey","doi":"10.1109/EUMA.1983.333310","DOIUrl":null,"url":null,"abstract":"The principle of local electric field measurements on microwave integrated circuits with radiating probes is described. The main conclusions of the numerical modeling of the probes are discussed. Experimental methods and results of measurement on models and on a monolithic integrated amplifier are presented.","PeriodicalId":105436,"journal":{"name":"1983 13th European Microwave Conference","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1983-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Test of Monolithic Microwave Integrated Circuits with Radiating Probes\",\"authors\":\"M. Hélier, J. Bolomey\",\"doi\":\"10.1109/EUMA.1983.333310\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The principle of local electric field measurements on microwave integrated circuits with radiating probes is described. The main conclusions of the numerical modeling of the probes are discussed. Experimental methods and results of measurement on models and on a monolithic integrated amplifier are presented.\",\"PeriodicalId\":105436,\"journal\":{\"name\":\"1983 13th European Microwave Conference\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1983-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1983 13th European Microwave Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EUMA.1983.333310\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1983 13th European Microwave Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUMA.1983.333310","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Test of Monolithic Microwave Integrated Circuits with Radiating Probes
The principle of local electric field measurements on microwave integrated circuits with radiating probes is described. The main conclusions of the numerical modeling of the probes are discussed. Experimental methods and results of measurement on models and on a monolithic integrated amplifier are presented.
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