{"title":"场效应管模型的能量和电荷守恒","authors":"C. Wilson, M. Schmidt-Szalowski, J. King","doi":"10.1109/EuMIC48047.2021.00055","DOIUrl":null,"url":null,"abstract":"This paper introduces a simple and accurate approach to extracting an energy and charge conservative model for the displacement current in a field-effect transistor (FET). Through careful fitting of the device transconductance time-delay parameter, a symmetric capacitance matrix is obtained that may be used directly to extract a single energy function in the form of an artificial neural network (ANN). Results show excellent capacitance fits across the full bias plane along with high-fidelity S-parameter fits at multiple bias points.","PeriodicalId":371692,"journal":{"name":"2020 15th European Microwave Integrated Circuits Conference (EuMIC)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-01-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Energy and Charge Conservation for FET Models\",\"authors\":\"C. Wilson, M. Schmidt-Szalowski, J. King\",\"doi\":\"10.1109/EuMIC48047.2021.00055\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper introduces a simple and accurate approach to extracting an energy and charge conservative model for the displacement current in a field-effect transistor (FET). Through careful fitting of the device transconductance time-delay parameter, a symmetric capacitance matrix is obtained that may be used directly to extract a single energy function in the form of an artificial neural network (ANN). Results show excellent capacitance fits across the full bias plane along with high-fidelity S-parameter fits at multiple bias points.\",\"PeriodicalId\":371692,\"journal\":{\"name\":\"2020 15th European Microwave Integrated Circuits Conference (EuMIC)\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-01-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 15th European Microwave Integrated Circuits Conference (EuMIC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EuMIC48047.2021.00055\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 15th European Microwave Integrated Circuits Conference (EuMIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EuMIC48047.2021.00055","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper introduces a simple and accurate approach to extracting an energy and charge conservative model for the displacement current in a field-effect transistor (FET). Through careful fitting of the device transconductance time-delay parameter, a symmetric capacitance matrix is obtained that may be used directly to extract a single energy function in the form of an artificial neural network (ANN). Results show excellent capacitance fits across the full bias plane along with high-fidelity S-parameter fits at multiple bias points.