锁定热成像技术定位功率二极管的预击穿泄漏电流

2009 Ph.D. Research in Microelectronics and Electronics Pub Date : 2009-07-12 DOI:10.1109/RME.2009.5201357

M. Riccio, A. Irace, G. Breglio

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引用次数: 4

摘要

在本文中，我们展示了锁相热成像(LIT)技术是如何获得功率二极管上预击穿泄漏电流分布信息的有效选择。为了做到这一点，我们描述了LIT原理和我们的内部实验装置。我们最终展示了功率肖特基二极管的有趣实验结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Lock-in thermography for the localization of prebreakdown leakage current on power diodes

In this paper we show how the Lock-In Thermography (LIT) technique is a valid choice to obtain information on the pre-breakdown leakage current distribution on power diodes. To do this we describe the LIT principle and our in house made experimental set-up. We finally show interesting experimental results on power Schottky diodes.

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2009 Ph.D. Research in Microelectronics and Electronics

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