{"title":"用环境应力筛选数据演示可靠性和可靠性增长","authors":"K. L. Wong","doi":"10.1109/ARMS.1990.67929","DOIUrl":null,"url":null,"abstract":"Problems with conventional reliability demonstration methods are addressed, and the conventional reliability-demonstration tests are compared with the environmental stress screening (ESS) method. The concept of the roller-coaster curve is reviewed. The aging process for electronics and the relative benefits of ESS and the roller-coaster curve are explored. Recommendations on implementing ESS for reliability demonstration and reliability assurance are provided.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Demonstrating reliability and reliability growth with environmental stress screening data\",\"authors\":\"K. L. Wong\",\"doi\":\"10.1109/ARMS.1990.67929\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Problems with conventional reliability demonstration methods are addressed, and the conventional reliability-demonstration tests are compared with the environmental stress screening (ESS) method. The concept of the roller-coaster curve is reviewed. The aging process for electronics and the relative benefits of ESS and the roller-coaster curve are explored. Recommendations on implementing ESS for reliability demonstration and reliability assurance are provided.<<ETX>>\",\"PeriodicalId\":383597,\"journal\":{\"name\":\"Annual Proceedings on Reliability and Maintainability Symposium\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-01-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Annual Proceedings on Reliability and Maintainability Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARMS.1990.67929\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Annual Proceedings on Reliability and Maintainability Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARMS.1990.67929","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Demonstrating reliability and reliability growth with environmental stress screening data
Problems with conventional reliability demonstration methods are addressed, and the conventional reliability-demonstration tests are compared with the environmental stress screening (ESS) method. The concept of the roller-coaster curve is reviewed. The aging process for electronics and the relative benefits of ESS and the roller-coaster curve are explored. Recommendations on implementing ESS for reliability demonstration and reliability assurance are provided.<>
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