{"title":"高频去嵌入网络及其误差分析","authors":"S. Dong, J. Lees, P. Tasker","doi":"10.1109/ICEICT.2016.7879754","DOIUrl":null,"url":null,"abstract":"The intrinsic performance of the devices is of great meaning during power amplifiers design. A method to update de-embedding network at 5.8 GHz for packaged power devices is put forward based on physical modeling idea. The de-embedding network of a packaged GaN HEMT is presented and its errors are analyzed based on waveform engineering. The results may well lead to optimization of the de-embedding network.","PeriodicalId":224387,"journal":{"name":"2016 IEEE International Conference on Electronic Information and Communication Technology (ICEICT)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A de-embedding network at higher frequency and its error analysis\",\"authors\":\"S. Dong, J. Lees, P. Tasker\",\"doi\":\"10.1109/ICEICT.2016.7879754\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The intrinsic performance of the devices is of great meaning during power amplifiers design. A method to update de-embedding network at 5.8 GHz for packaged power devices is put forward based on physical modeling idea. The de-embedding network of a packaged GaN HEMT is presented and its errors are analyzed based on waveform engineering. The results may well lead to optimization of the de-embedding network.\",\"PeriodicalId\":224387,\"journal\":{\"name\":\"2016 IEEE International Conference on Electronic Information and Communication Technology (ICEICT)\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE International Conference on Electronic Information and Communication Technology (ICEICT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICEICT.2016.7879754\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Conference on Electronic Information and Communication Technology (ICEICT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEICT.2016.7879754","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A de-embedding network at higher frequency and its error analysis
The intrinsic performance of the devices is of great meaning during power amplifiers design. A method to update de-embedding network at 5.8 GHz for packaged power devices is put forward based on physical modeling idea. The de-embedding network of a packaged GaN HEMT is presented and its errors are analyzed based on waveform engineering. The results may well lead to optimization of the de-embedding network.
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