Jingyun Zhang, T. Ando, C. Yeung, Miaomiao Wang, O. Kwon, R. Galatage, R. Chao, N. Loubet, B. Moon, R. Bao, R. Vega, Juntao Li, Chen Zhang, Zuoguang Liu, M. Kang, Xin He Miao, Junli Wang, S. Kanakasabapathy, V. Basker, H. Jagannathan, T. Yamashita
{"title":"高k金属栅极的基础学习和多电压选择的堆叠纳米片栅极全能晶体管","authors":"Jingyun Zhang, T. Ando, C. Yeung, Miaomiao Wang, O. Kwon, R. Galatage, R. Chao, N. Loubet, B. Moon, R. Bao, R. Vega, Juntao Li, Chen Zhang, Zuoguang Liu, M. Kang, Xin He Miao, Junli Wang, S. Kanakasabapathy, V. Basker, H. Jagannathan, T. Yamashita","doi":"10.1109/IEDM.2017.8268438","DOIUrl":null,"url":null,"abstract":"In this paper, we report multi-threshold-voltage (multi-Vt) options for stacked Nanosheet gate-all-around (GAA) transistors. V<inf>t</inf> can be modulated through workfunction metal (WFM) thickness as well as the inter-nanosheet spacing (T<inf>sus</inf>), the combination of which may be leveraged to increase the number of undoped V<inf>t</inf> offerings within a CMOS device menu relative to a FinFET CMOS device menu, which fundamentally does not have T<inf>sus</inf> as a V<inf>t</inf> tuning option. Hence we propose our multi-V<inf>t</inf> scheme by taking advantage of the unique structure of stacked GAA transistor.","PeriodicalId":412333,"journal":{"name":"2017 IEEE International Electron Devices Meeting (IEDM)","volume":"27 1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"34","resultStr":"{\"title\":\"High-k metal gate fundamental learning and multi-Vt options for stacked nanosheet gate-all-around transistor\",\"authors\":\"Jingyun Zhang, T. Ando, C. Yeung, Miaomiao Wang, O. Kwon, R. Galatage, R. Chao, N. Loubet, B. Moon, R. Bao, R. Vega, Juntao Li, Chen Zhang, Zuoguang Liu, M. Kang, Xin He Miao, Junli Wang, S. Kanakasabapathy, V. Basker, H. Jagannathan, T. Yamashita\",\"doi\":\"10.1109/IEDM.2017.8268438\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we report multi-threshold-voltage (multi-Vt) options for stacked Nanosheet gate-all-around (GAA) transistors. V<inf>t</inf> can be modulated through workfunction metal (WFM) thickness as well as the inter-nanosheet spacing (T<inf>sus</inf>), the combination of which may be leveraged to increase the number of undoped V<inf>t</inf> offerings within a CMOS device menu relative to a FinFET CMOS device menu, which fundamentally does not have T<inf>sus</inf> as a V<inf>t</inf> tuning option. Hence we propose our multi-V<inf>t</inf> scheme by taking advantage of the unique structure of stacked GAA transistor.\",\"PeriodicalId\":412333,\"journal\":{\"name\":\"2017 IEEE International Electron Devices Meeting (IEDM)\",\"volume\":\"27 1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"34\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE International Electron Devices Meeting (IEDM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.2017.8268438\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE International Electron Devices Meeting (IEDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2017.8268438","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
High-k metal gate fundamental learning and multi-Vt options for stacked nanosheet gate-all-around transistor
In this paper, we report multi-threshold-voltage (multi-Vt) options for stacked Nanosheet gate-all-around (GAA) transistors. Vt can be modulated through workfunction metal (WFM) thickness as well as the inter-nanosheet spacing (Tsus), the combination of which may be leveraged to increase the number of undoped Vt offerings within a CMOS device menu relative to a FinFET CMOS device menu, which fundamentally does not have Tsus as a Vt tuning option. Hence we propose our multi-Vt scheme by taking advantage of the unique structure of stacked GAA transistor.