全息模式测量系统(HPMS)及其在电接触弹簧热变形中的应用

M. Taniguchi, M. Oki, T. Takagi
{"title":"全息模式测量系统(HPMS)及其在电接触弹簧热变形中的应用","authors":"M. Taniguchi, M. Oki, T. Takagi","doi":"10.1109/CPEM.1988.671344","DOIUrl":null,"url":null,"abstract":"The HPMS is a technique developed by the authors which can measure the vibration or deformation of any object by means of the holographic interferogram analysis. This technique was applied to the microscopic displacement of an electric contact spring which was thermally deformed due to contact current. A deformed contact spring shape was obtained with an accuracy of 0.16/spl mu/m, and it was proved that the HPMS was a very good technique for measuring a microscopic movement of the object such as a fretting phenomenon in electric contacts.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A Holographic Pattern Measuring System (HPMS) and Its Application to the Thermal Deformation of an Electrical Contact Spring\",\"authors\":\"M. Taniguchi, M. Oki, T. Takagi\",\"doi\":\"10.1109/CPEM.1988.671344\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The HPMS is a technique developed by the authors which can measure the vibration or deformation of any object by means of the holographic interferogram analysis. This technique was applied to the microscopic displacement of an electric contact spring which was thermally deformed due to contact current. A deformed contact spring shape was obtained with an accuracy of 0.16/spl mu/m, and it was proved that the HPMS was a very good technique for measuring a microscopic movement of the object such as a fretting phenomenon in electric contacts.\",\"PeriodicalId\":326579,\"journal\":{\"name\":\"1988 Conference on Precision Electromagnetic Measurements\",\"volume\":\"41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-06-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1988 Conference on Precision Electromagnetic Measurements\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CPEM.1988.671344\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1988 Conference on Precision Electromagnetic Measurements","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.1988.671344","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

HPMS是作者开发的一种通过全息干涉图分析来测量任何物体的振动或变形的技术。将该技术应用于接触电流引起热变形的电接触弹簧的微观位移。得到了一个变形的接触弹簧形状,精度为0.16/spl mu/m,证明了HPMS是测量物体微观运动(如电触点中的微动现象)的一种很好的技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
A Holographic Pattern Measuring System (HPMS) and Its Application to the Thermal Deformation of an Electrical Contact Spring
The HPMS is a technique developed by the authors which can measure the vibration or deformation of any object by means of the holographic interferogram analysis. This technique was applied to the microscopic displacement of an electric contact spring which was thermally deformed due to contact current. A deformed contact spring shape was obtained with an accuracy of 0.16/spl mu/m, and it was proved that the HPMS was a very good technique for measuring a microscopic movement of the object such as a fretting phenomenon in electric contacts.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Industrial experience with an array Josephson junction Optical Ftber Length Measurement By External Phase Modulatton Type Optical Heterodyne Reflectometry Convenient Error Estimating Method for Current Transformer Test System Using Current Comparator A calculable, transportable audio-frequency AC reference standard New Trench Depth Measurement System with Wavelength-Rapidly-Scanning Acousto-Optic Tunable Filter for VLSI DRAMs Capacitor Cells
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1