一种硅可配置测试流程的新方法和通过共享控制器测试、调试和表征不同类型嵌入式存储器的算法

Swapnil Bahl
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引用次数: 7

摘要

在当今的片上系统(SOC)中,存储器占据了很大一部分(/spl sim/70%)。SoC的整体产率很大程度上依赖于内存产率。为了最大限度地减少测试和诊断的工作量,我们提出了一个系统的硅可配置的测试流程和算法为不同类型的存储器,包括多端口存储器,通过一个共享控制器。它支持制造测试以及诊断和记忆的电气交流特性。所提出的基于微码的可配置控制器具有低面积开销,使测试工程师可以用很少的微码自由地完成片上测试。
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A novel method for silicon configurable test flow and algorithms for testing, debugging and characterizing different types of embedded memories through a shared controller
In present day system-on-chips (SOC), a large part (/spl sim/70%) is occupied by memories. The overall yield of the SoC relies heavily on the memory yield. To minimize the test and diagnosis effort, we present a system for silicon configurable test flow and algorithms for different types of memories including multi-port memories, through a shared controller. It supports manufacturing tests as well as diagnosis and electrical AC characterisation of memories. With low area overhead, the proposed microcode based configurable controller gives the test engineer freedom to do complete testing on-chip with few micro-codes.
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Built-in self-test and repair (BISTR) techniques for embedded RAMs Redundancy - it's not just for defects any more Do we need anything more than single bit error correction (ECC)? Embedded memory reliability: the SER challenge A novel method for silicon configurable test flow and algorithms for testing, debugging and characterizing different types of embedded memories through a shared controller
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