光子系统的突变和参数故障建模

Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06) Pub Date : 2006-01-17 DOI:10.1109/DELTA.2006.21

M. Aljada, A. Osseiran, K. Alameh

{"title":"光子系统的突变和参数故障建模","authors":"M. Aljada, A. Osseiran, K. Alameh","doi":"10.1109/DELTA.2006.21","DOIUrl":null,"url":null,"abstract":"In this paper, we investigate the impact of the most common catastrophic and parametric faults in photonic systems. We demonstrate, using the example of a photonic correlator, the effectiveness of testing techniques for fault detection in photonic systems. To the best of our knowledge, this constitutes the first attempt to define a fault model and to develop a test methodology for photonic systems.","PeriodicalId":439448,"journal":{"name":"Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Catastrophic and parametric fault modelling for photonic systems\",\"authors\":\"M. Aljada, A. Osseiran, K. Alameh\",\"doi\":\"10.1109/DELTA.2006.21\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we investigate the impact of the most common catastrophic and parametric faults in photonic systems. We demonstrate, using the example of a photonic correlator, the effectiveness of testing techniques for fault detection in photonic systems. To the best of our knowledge, this constitutes the first attempt to define a fault model and to develop a test methodology for photonic systems.\",\"PeriodicalId\":439448,\"journal\":{\"name\":\"Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-01-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DELTA.2006.21\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DELTA.2006.21","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

在本文中，我们研究了光子系统中最常见的突变和参数故障的影响。我们以光子相关器为例，证明了测试技术在光子系统故障检测中的有效性。据我们所知，这构成了定义故障模型和开发光子系统测试方法的第一次尝试。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

Catastrophic and parametric fault modelling for photonic systems

In this paper, we investigate the impact of the most common catastrophic and parametric faults in photonic systems. We demonstrate, using the example of a photonic correlator, the effectiveness of testing techniques for fault detection in photonic systems. To the best of our knowledge, this constitutes the first attempt to define a fault model and to develop a test methodology for photonic systems.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)

自引率

0.00%

发文量