M. Popescu, F. Sava, A. Lőrinczi, P. Koch, T. Gutberlet, W. Uebach, H. Bradaczek, E. Vateva, D. Nesheva
{"title":"Se/CdSe多层膜的热稳定性","authors":"M. Popescu, F. Sava, A. Lőrinczi, P. Koch, T. Gutberlet, W. Uebach, H. Bradaczek, E. Vateva, D. Nesheva","doi":"10.1109/SMICND.1996.557384","DOIUrl":null,"url":null,"abstract":"The structure and the thermal stability of amorphous Se/CdSe multilayers have been investigated by X-ray diffraction. The multilayers are stable up to 60/spl deg/C. During thermal treatment firstly hexagonal selenium and then hexagonal CdSe phase are gradually separated.","PeriodicalId":266178,"journal":{"name":"1996 International Semiconductor Conference. 19th Edition. CAS'96 Proceedings","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Thermal stability of Se/CdSe multilayers\",\"authors\":\"M. Popescu, F. Sava, A. Lőrinczi, P. Koch, T. Gutberlet, W. Uebach, H. Bradaczek, E. Vateva, D. Nesheva\",\"doi\":\"10.1109/SMICND.1996.557384\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The structure and the thermal stability of amorphous Se/CdSe multilayers have been investigated by X-ray diffraction. The multilayers are stable up to 60/spl deg/C. During thermal treatment firstly hexagonal selenium and then hexagonal CdSe phase are gradually separated.\",\"PeriodicalId\":266178,\"journal\":{\"name\":\"1996 International Semiconductor Conference. 19th Edition. CAS'96 Proceedings\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-10-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1996 International Semiconductor Conference. 19th Edition. CAS'96 Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMICND.1996.557384\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 International Semiconductor Conference. 19th Edition. CAS'96 Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.1996.557384","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The structure and the thermal stability of amorphous Se/CdSe multilayers have been investigated by X-ray diffraction. The multilayers are stable up to 60/spl deg/C. During thermal treatment firstly hexagonal selenium and then hexagonal CdSe phase are gradually separated.
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