{"title":"功能级可测试性评价的可控性和可观察性度量","authors":"M. Jamoussi, B. Kaminska","doi":"10.1109/VTEST.1993.313332","DOIUrl":null,"url":null,"abstract":"An approach of a functional-level testability evaluation, based on controllability and observability measures (c.o.m.), is proposed. Using Rutman's system model, ordinary applied at the gate level, c.o.m are extended to the data-path level, to permit incorporation of testability constraints in the high-level synthesis stage. The approach of computing these c.o.m. is based on the reduced ordered binary decision diagram (ROBDD) circuit representation. It is shown how to identify untestable parts of a data path and how to evaluate its test cost. The insertion of a two-variable multiplexor, as a structural modification in the data path, is suggested to improve the c.o.m., and so, the test cost. To evaluate the impact of this transformation on the data-path testability, an objective function is proposed, appropriate for high-level synthesis.<<ETX>>","PeriodicalId":283218,"journal":{"name":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Controllability and observability measures for functional-level testability evaluation\",\"authors\":\"M. Jamoussi, B. Kaminska\",\"doi\":\"10.1109/VTEST.1993.313332\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An approach of a functional-level testability evaluation, based on controllability and observability measures (c.o.m.), is proposed. Using Rutman's system model, ordinary applied at the gate level, c.o.m are extended to the data-path level, to permit incorporation of testability constraints in the high-level synthesis stage. The approach of computing these c.o.m. is based on the reduced ordered binary decision diagram (ROBDD) circuit representation. It is shown how to identify untestable parts of a data path and how to evaluate its test cost. The insertion of a two-variable multiplexor, as a structural modification in the data path, is suggested to improve the c.o.m., and so, the test cost. To evaluate the impact of this transformation on the data-path testability, an objective function is proposed, appropriate for high-level synthesis.<<ETX>>\",\"PeriodicalId\":283218,\"journal\":{\"name\":\"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium\",\"volume\":\"41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-04-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.1993.313332\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1993.313332","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Controllability and observability measures for functional-level testability evaluation
An approach of a functional-level testability evaluation, based on controllability and observability measures (c.o.m.), is proposed. Using Rutman's system model, ordinary applied at the gate level, c.o.m are extended to the data-path level, to permit incorporation of testability constraints in the high-level synthesis stage. The approach of computing these c.o.m. is based on the reduced ordered binary decision diagram (ROBDD) circuit representation. It is shown how to identify untestable parts of a data path and how to evaluate its test cost. The insertion of a two-variable multiplexor, as a structural modification in the data path, is suggested to improve the c.o.m., and so, the test cost. To evaluate the impact of this transformation on the data-path testability, an objective function is proposed, appropriate for high-level synthesis.<>