M. Scholz, R. Ashton, T. Smedes, R. Derikx, M. Dekker, J. Barth
{"title":"HMM单站点测试:我们可以用HMM文档重现组件故障级别吗?","authors":"M. Scholz, R. Ashton, T. Smedes, R. Derikx, M. Dekker, J. Barth","doi":"10.1109/EOSESD.2016.7592539","DOIUrl":null,"url":null,"abstract":"The ESDA working group 5.6 has conducted single site testing to evaluate the repeatability of passfail results when using the setups in the standard practice 5.6 document. A ten times lower standard deviation is obtained in comparison to the 2011 round robin.","PeriodicalId":239756,"journal":{"name":"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"HMM single site testing: Can we reproduce component failure level with the HMM document?\",\"authors\":\"M. Scholz, R. Ashton, T. Smedes, R. Derikx, M. Dekker, J. Barth\",\"doi\":\"10.1109/EOSESD.2016.7592539\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The ESDA working group 5.6 has conducted single site testing to evaluate the repeatability of passfail results when using the setups in the standard practice 5.6 document. A ten times lower standard deviation is obtained in comparison to the 2011 round robin.\",\"PeriodicalId\":239756,\"journal\":{\"name\":\"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)\",\"volume\":\"58 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EOSESD.2016.7592539\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EOSESD.2016.7592539","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
HMM single site testing: Can we reproduce component failure level with the HMM document?
The ESDA working group 5.6 has conducted single site testing to evaluate the repeatability of passfail results when using the setups in the standard practice 5.6 document. A ten times lower standard deviation is obtained in comparison to the 2011 round robin.