符号系统级可靠性分析

M. Glaß, M. Lukasiewycz, Felix Reimann, C. Haubelt, J. Teich
{"title":"符号系统级可靠性分析","authors":"M. Glaß, M. Lukasiewycz, Felix Reimann, C. Haubelt, J. Teich","doi":"10.1109/ICCAD.2010.5654134","DOIUrl":null,"url":null,"abstract":"More and more embedded systems provide a multitude of services, implemented by a large number of networked hardware components. In early design phases, dimensioning such complex systems in terms of monetary costs, power consumption, reliability etc. demands for new analysis approaches at the electronic system level. In this paper, two symbolic system level reliability analysis approaches are introduced. First, a formal approach based on Binary Decision Diagrams is presented that allows to calculate exact reliability measures for small to moderate-sized systems. Second, a simulative approach is presented that hybridizes a Monte Carlo simulation with a SAT solver and delivers adequate approximations of the reliability measures for large and complex systems.","PeriodicalId":344703,"journal":{"name":"2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Symbolic system level reliability analysis\",\"authors\":\"M. Glaß, M. Lukasiewycz, Felix Reimann, C. Haubelt, J. Teich\",\"doi\":\"10.1109/ICCAD.2010.5654134\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"More and more embedded systems provide a multitude of services, implemented by a large number of networked hardware components. In early design phases, dimensioning such complex systems in terms of monetary costs, power consumption, reliability etc. demands for new analysis approaches at the electronic system level. In this paper, two symbolic system level reliability analysis approaches are introduced. First, a formal approach based on Binary Decision Diagrams is presented that allows to calculate exact reliability measures for small to moderate-sized systems. Second, a simulative approach is presented that hybridizes a Monte Carlo simulation with a SAT solver and delivers adequate approximations of the reliability measures for large and complex systems.\",\"PeriodicalId\":344703,\"journal\":{\"name\":\"2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-11-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCAD.2010.5654134\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCAD.2010.5654134","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11

摘要

越来越多的嵌入式系统提供大量的服务,由大量的网络硬件组件实现。在早期设计阶段,从货币成本、功耗、可靠性等方面对如此复杂的系统进行量纲化,需要在电子系统层面采用新的分析方法。本文介绍了两种符号系统级可靠性分析方法。首先,提出了一种基于二元决策图的形式化方法,允许计算小型到中等规模系统的精确可靠性度量。其次,提出了一种模拟方法,该方法将蒙特卡罗模拟与SAT求解器相结合,并为大型复杂系统提供了足够的可靠性度量近似值。
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Symbolic system level reliability analysis
More and more embedded systems provide a multitude of services, implemented by a large number of networked hardware components. In early design phases, dimensioning such complex systems in terms of monetary costs, power consumption, reliability etc. demands for new analysis approaches at the electronic system level. In this paper, two symbolic system level reliability analysis approaches are introduced. First, a formal approach based on Binary Decision Diagrams is presented that allows to calculate exact reliability measures for small to moderate-sized systems. Second, a simulative approach is presented that hybridizes a Monte Carlo simulation with a SAT solver and delivers adequate approximations of the reliability measures for large and complex systems.
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