{"title":"基于引线电磁模型的AIMD引线公差数值分析","authors":"M. Kozlov, W. Kainz","doi":"10.1109/USNC-URSI.2019.8861794","DOIUrl":null,"url":null,"abstract":"Influence of lead tolerances on the RF-induced power deposition (P) near a lead electrode was analyzed using the lead electromagnetic model and two sets of incident electric fields (Etan) with different profiles. Our results indicate that tolerance analysis shall be done for all lead lengths and clinically relevant Etan because the sensitivity of P to a given variation of the lead properties can differ by an order of magnitude.","PeriodicalId":383603,"journal":{"name":"2019 USNC-URSI Radio Science Meeting (Joint with AP-S Symposium)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Numerical Analysis of AIMD Lead Tolerances Using the Lead Electromagnetic Model\",\"authors\":\"M. Kozlov, W. Kainz\",\"doi\":\"10.1109/USNC-URSI.2019.8861794\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Influence of lead tolerances on the RF-induced power deposition (P) near a lead electrode was analyzed using the lead electromagnetic model and two sets of incident electric fields (Etan) with different profiles. Our results indicate that tolerance analysis shall be done for all lead lengths and clinically relevant Etan because the sensitivity of P to a given variation of the lead properties can differ by an order of magnitude.\",\"PeriodicalId\":383603,\"journal\":{\"name\":\"2019 USNC-URSI Radio Science Meeting (Joint with AP-S Symposium)\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-10-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 USNC-URSI Radio Science Meeting (Joint with AP-S Symposium)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/USNC-URSI.2019.8861794\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 USNC-URSI Radio Science Meeting (Joint with AP-S Symposium)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/USNC-URSI.2019.8861794","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Numerical Analysis of AIMD Lead Tolerances Using the Lead Electromagnetic Model
Influence of lead tolerances on the RF-induced power deposition (P) near a lead electrode was analyzed using the lead electromagnetic model and two sets of incident electric fields (Etan) with different profiles. Our results indicate that tolerance analysis shall be done for all lead lengths and clinically relevant Etan because the sensitivity of P to a given variation of the lead properties can differ by an order of magnitude.