{"title":"带电电缆系统ESD事件","authors":"P. Tamminen, T. Viheriakoski","doi":"10.1109/EOSESD.2016.7592559","DOIUrl":null,"url":null,"abstract":"A charged electronic system failed while it was connected to a USB port. The resulting discharge current waveform had a sub-nanosecond initial peak that bypassed on-board protection devices. In this study the ESD stress waveform is analyzed with simulation and measurement methods.","PeriodicalId":239756,"journal":{"name":"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Charged cable—system ESD event\",\"authors\":\"P. Tamminen, T. Viheriakoski\",\"doi\":\"10.1109/EOSESD.2016.7592559\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A charged electronic system failed while it was connected to a USB port. The resulting discharge current waveform had a sub-nanosecond initial peak that bypassed on-board protection devices. In this study the ESD stress waveform is analyzed with simulation and measurement methods.\",\"PeriodicalId\":239756,\"journal\":{\"name\":\"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EOSESD.2016.7592559\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EOSESD.2016.7592559","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A charged electronic system failed while it was connected to a USB port. The resulting discharge current waveform had a sub-nanosecond initial peak that bypassed on-board protection devices. In this study the ESD stress waveform is analyzed with simulation and measurement methods.
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