Q. Ding, Yu Wang, Hui Wang, Rong Luo, Huazhong Yang
{"title":"降低关键路径软错误率的输出重映射技术","authors":"Q. Ding, Yu Wang, Hui Wang, Rong Luo, Huazhong Yang","doi":"10.1109/ISQED.2008.86","DOIUrl":null,"url":null,"abstract":"It is expected that the soft error rate (SER) of combinational logic will increase significantly. Previous solutions to mitigate soft errors in combinational logic suffer from delay penalty or area/power overhead. In this paper, we proposed an output remapping technique to reduce SER of critical paths. Experimental results show up to about 20X increase in Qcritical. So the SER is reduced significantly. This method does not introduce any delay penalty. The area/power overhead is limited as well. The output remapping method is based on our novel glitch width model. The analysis shows that output remapping technique works well along with technology scaling.","PeriodicalId":243121,"journal":{"name":"9th International Symposium on Quality Electronic Design (isqed 2008)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Output Remapping Technique for Soft-Error Rate Reduction in Critical Paths\",\"authors\":\"Q. Ding, Yu Wang, Hui Wang, Rong Luo, Huazhong Yang\",\"doi\":\"10.1109/ISQED.2008.86\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"It is expected that the soft error rate (SER) of combinational logic will increase significantly. Previous solutions to mitigate soft errors in combinational logic suffer from delay penalty or area/power overhead. In this paper, we proposed an output remapping technique to reduce SER of critical paths. Experimental results show up to about 20X increase in Qcritical. So the SER is reduced significantly. This method does not introduce any delay penalty. The area/power overhead is limited as well. The output remapping method is based on our novel glitch width model. The analysis shows that output remapping technique works well along with technology scaling.\",\"PeriodicalId\":243121,\"journal\":{\"name\":\"9th International Symposium on Quality Electronic Design (isqed 2008)\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-03-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"9th International Symposium on Quality Electronic Design (isqed 2008)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2008.86\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"9th International Symposium on Quality Electronic Design (isqed 2008)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2008.86","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Output Remapping Technique for Soft-Error Rate Reduction in Critical Paths
It is expected that the soft error rate (SER) of combinational logic will increase significantly. Previous solutions to mitigate soft errors in combinational logic suffer from delay penalty or area/power overhead. In this paper, we proposed an output remapping technique to reduce SER of critical paths. Experimental results show up to about 20X increase in Qcritical. So the SER is reduced significantly. This method does not introduce any delay penalty. The area/power overhead is limited as well. The output remapping method is based on our novel glitch width model. The analysis shows that output remapping technique works well along with technology scaling.