用于调试和测试的电压瞬态检测和感应

Rex Petersen, P. Pant, Pablo Lopez, Aaron Barton, Jim Ignowski, Doug Josephson
{"title":"用于调试和测试的电压瞬态检测和感应","authors":"Rex Petersen, P. Pant, Pablo Lopez, Aaron Barton, Jim Ignowski, Doug Josephson","doi":"10.1109/TEST.2009.5355542","DOIUrl":null,"url":null,"abstract":"Voltage transients from circuit activity impact operation, testing and debug of complex designs. This paper describes a system which enables voltage transient detection and a capability to induce voltage transients in a controlled manner. Usage models and silicon results are described, along with limitations and future options for improvements.","PeriodicalId":419063,"journal":{"name":"2009 International Test Conference","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"44","resultStr":"{\"title\":\"Voltage transient detection and induction for debug and test\",\"authors\":\"Rex Petersen, P. Pant, Pablo Lopez, Aaron Barton, Jim Ignowski, Doug Josephson\",\"doi\":\"10.1109/TEST.2009.5355542\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Voltage transients from circuit activity impact operation, testing and debug of complex designs. This paper describes a system which enables voltage transient detection and a capability to induce voltage transients in a controlled manner. Usage models and silicon results are described, along with limitations and future options for improvements.\",\"PeriodicalId\":419063,\"journal\":{\"name\":\"2009 International Test Conference\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-12-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"44\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2009.5355542\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2009.5355542","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 44

摘要

电路活动产生的电压瞬变影响复杂设计的运行、测试和调试。本文介绍了一种能够进行电压暂态检测并能以可控方式感应电压暂态的系统。描述了使用模型和硅的结果,以及限制和未来的改进选项。
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Voltage transient detection and induction for debug and test
Voltage transients from circuit activity impact operation, testing and debug of complex designs. This paper describes a system which enables voltage transient detection and a capability to induce voltage transients in a controlled manner. Usage models and silicon results are described, along with limitations and future options for improvements.
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