A. Soman, G. Obikoya, S. Johnston, Stephen B. Harvey, U. Das, S. Hegedus
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Stability of Silicon Heterojunction solar cells having hydrogen plasma treated intrinsic layer
The open-circuit voltage of Silicon Heterojunction (HJ) cells can be improved by using extrinsic hydrogen plasma treatment (HPT) to reduce the trap states (NT) which we have verified using Deep Level Transient Spectroscopy (DLTS). However, hydrogen has been associated with long-term degradation. We have investigated the stability of HJ cells with and without HPT using accelerated degradation (1-sun illumination, $\boldsymbol{90^{\circ}}\mathbf{C}$ temperature, argon ambient for 1000 hours). The stability has been studied using DLTS, current-voltage, and Suns-Voc. Our results show HPT cells are stable and maintain their higher Voc and lower NT after accelerated degradation.