基于SOI的超陡亚阈斜率MOSFET超低电压应用的可能性

Takayuki Mori, J. Ida
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引用次数: 3

摘要

超低功耗(ULP) LSI需要陡的亚阈值斜率(SS) MOSFET。然而,在室温下,传统MOSFET的理论SS极限为60mV/dec。近年来,人们研究了功率小于60mV/dec的器件,如隧道场效应管(TFET)和冲击电离MOS (I-MOS)。此外,还提出了采用浮体(FB) SOI的陡坡SS MOSFET。在这项工作中,我们报告了我们的发现FB和体系(BT) SOI MOSFET具有超陡SS (<;1mV/Dec)特性与0.15um SOI。我们还讨论了它作为超低电压应用的开关器件的可能性,其中我们认为这三点是有待改进的问题;降低工作电压,提高离子/开关比,同时注意保持低开关,控制迟滞特性。
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Possibility of SOI based super steep subthreshold slope MOSFET for ultra low voltage application
Ultra Low Power (ULP) LSI's require the steep subthreshold slope (SS) MOSFET. However, the theoretical SS limit of the conventional MOSFET is 60mV/dec at the room temperature. Recently, devices which have the less than 60mV/dec SS, such as the Tunnel FET (TFET) and the Impact Ionization MOS (I-MOS), have been studied. In addition to those, the steep SS MOSFET's using the Floating-Body (FB) SOI have been proposed. In this work, we report our finding of the FB and the Body-Tied (BT) SOI MOSFET with the super steep SS (<; 1mV/Dec) characteristics with the 0.15um SOI. We also discuss the possibility of it as a switching device for the ultra low voltage application, where we consider that the three points are the issues to improve; reducing the operation voltage, increasing Ion/Ioff ratios which also pay attention keeping the low Ioff, controlling hysteresis characteristics.
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