朝着更有效的BIT蓝图内置测试

G. Daugherty, M. Steinmetz
{"title":"朝着更有效的BIT蓝图内置测试","authors":"G. Daugherty, M. Steinmetz","doi":"10.1109/ARMS.1990.67983","DOIUrl":null,"url":null,"abstract":"Information is provided concerning built-in test (BIT) and its importance to the military user. The paper is directed at the engineers who design the mission equipment. The discussion points to the need for greater availability in development of weapon systems. To most designers, availability is an unknown and unquantifiable metric that is often ignored. Availability must be defined in terms more easily understood by the design community.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"BIT blueprint toward more effective built-in test\",\"authors\":\"G. Daugherty, M. Steinmetz\",\"doi\":\"10.1109/ARMS.1990.67983\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Information is provided concerning built-in test (BIT) and its importance to the military user. The paper is directed at the engineers who design the mission equipment. The discussion points to the need for greater availability in development of weapon systems. To most designers, availability is an unknown and unquantifiable metric that is often ignored. Availability must be defined in terms more easily understood by the design community.<<ETX>>\",\"PeriodicalId\":383597,\"journal\":{\"name\":\"Annual Proceedings on Reliability and Maintainability Symposium\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-01-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Annual Proceedings on Reliability and Maintainability Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARMS.1990.67983\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Annual Proceedings on Reliability and Maintainability Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARMS.1990.67983","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

提供了有关内置测试(BIT)及其对军事用户的重要性的信息。这篇论文是针对设计任务设备的工程师的。讨论指出,在武器系统的发展中需要更多的可用性。对于大多数设计师来说,可用性是一个未知的、不可量化的指标,经常被忽略。可用性必须以设计团体更容易理解的术语来定义。
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BIT blueprint toward more effective built-in test
Information is provided concerning built-in test (BIT) and its importance to the military user. The paper is directed at the engineers who design the mission equipment. The discussion points to the need for greater availability in development of weapon systems. To most designers, availability is an unknown and unquantifiable metric that is often ignored. Availability must be defined in terms more easily understood by the design community.<>
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