在电致发光启动电流范围内测量LED P-I特性斜率的安装

I. Frolov, O. Radaev, V. Sergeev
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引用次数: 0

摘要

众所周知,InGaN/GaN LED异质结构的缺陷导致LED光输出功率电流(P-I)特性的斜率减小。这在微电流模式下尤为明显。已经开发了一个自动化装置,用于测量LED在5 μ A…3 mA电流范围内的P-I特性的斜率。绿色商用LED样品的一个例子表明,在LED异质结构中,P-I特性的斜率与缺陷密度之间存在高度相关性。该测量装置可用于led的质量控制系统。
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Installation for Measuring of the Slope of the P-I Characteristic of the LED in the Range of the Electroluminescence Start Currents
It is known that defects of InGaN/GaN LED heterostructure lead to a decrease of the slope of the light output power-current (P-I) characteristic of the LED. This is especially pronounced in microcurrent mode. An automated installation has been developed for measuring of the slope of the P-I characteristic of the LED in the current range of 5 µA … 3 mA. An example of a sample of green commercial LEDs shows the presence of a high correlation between the slope of the P-I characteristic and the defects density in the heterostructure of the LED. The measuring installation can be used in the system of quality control of LEDs.
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