{"title":"模拟I2L性能和操作限制","authors":"D. Estreich, R. Dutton","doi":"10.1109/ISSCC.1977.1155677","DOIUrl":null,"url":null,"abstract":"CONVENTIONAL integrated injection logicl~’ (12L) has the attractive features of high density, low power-delay product, and simple fabrication sequence. However, the NPN current gain falloff associated with narrow, high fanout 12L gates severely limits the maximum gate operational speed. Furthermore, high current effects reduce injector transport efficiency, thus, increasing the powerdelay product. Figure 1 shows a complete 12L macromodel which includes the NPN current gain falloff and injector high current effects. Lateral current transport between adjacent gates is included in the macromodel’. The macromodel is synthesized from standard circuit elements making it compatible with commonly used circuit simulators, and, except for the NPN base resistance, requires only readily measured electrical parameters for definition; Table I. Ebers-Moll equivalent circuits are used to model the NPN transistor action of each collector; Q 1 Qq in Figure 1 for a fanout of four gate. Modeling the high-current NPN current gain falloff characteristics requires proper partitioning of the NPN base recombination currents and inclusion of the base resistance. Figure 2(a) illustrates the partitioning of the NPN base region for a narrow, fanout of four gate with base contact nearest the injector end. Section A is the base contact region and sections B-E are the active regions. The fractional recombination current for each active section is modeled by the dc current gain of the NPN, whereas, for the base contact region, it is accounted for by the saturation current of diode DCN. Base current measurements are required for gates of differing fanout counts using a consistent set of layout rules and fabrication. Figure 2(b) shows the partitioned base region with injected current de current paths, assuming the injector to be located at the base contact end of the base region. Using the geometry of these shaded current paths and the base sheet resistance, the b a e resistance components may be determined. Base resistance components, RBI R B ~ , are included in the macromodel as -","PeriodicalId":416313,"journal":{"name":"1977 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Modeling I2L performance and operational limits\",\"authors\":\"D. Estreich, R. Dutton\",\"doi\":\"10.1109/ISSCC.1977.1155677\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"CONVENTIONAL integrated injection logicl~’ (12L) has the attractive features of high density, low power-delay product, and simple fabrication sequence. However, the NPN current gain falloff associated with narrow, high fanout 12L gates severely limits the maximum gate operational speed. Furthermore, high current effects reduce injector transport efficiency, thus, increasing the powerdelay product. Figure 1 shows a complete 12L macromodel which includes the NPN current gain falloff and injector high current effects. Lateral current transport between adjacent gates is included in the macromodel’. The macromodel is synthesized from standard circuit elements making it compatible with commonly used circuit simulators, and, except for the NPN base resistance, requires only readily measured electrical parameters for definition; Table I. Ebers-Moll equivalent circuits are used to model the NPN transistor action of each collector; Q 1 Qq in Figure 1 for a fanout of four gate. Modeling the high-current NPN current gain falloff characteristics requires proper partitioning of the NPN base recombination currents and inclusion of the base resistance. Figure 2(a) illustrates the partitioning of the NPN base region for a narrow, fanout of four gate with base contact nearest the injector end. Section A is the base contact region and sections B-E are the active regions. The fractional recombination current for each active section is modeled by the dc current gain of the NPN, whereas, for the base contact region, it is accounted for by the saturation current of diode DCN. Base current measurements are required for gates of differing fanout counts using a consistent set of layout rules and fabrication. Figure 2(b) shows the partitioned base region with injected current de current paths, assuming the injector to be located at the base contact end of the base region. Using the geometry of these shaded current paths and the base sheet resistance, the b a e resistance components may be determined. Base resistance components, RBI R B ~ , are included in the macromodel as -\",\"PeriodicalId\":416313,\"journal\":{\"name\":\"1977 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1977 IEEE International Solid-State Circuits Conference. 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引用次数: 1
摘要
传统的集成注射逻辑(12L)具有密度高、产品功耗低、制作流程简单等优点。然而,与窄的高扇出12L栅极相关的NPN电流增益衰减严重限制了栅极的最大工作速度。此外,高电流效应降低了注入器传输效率,从而增加了功率延迟积。图1显示了一个完整的12L宏模型,包括NPN电流增益衰减和注入器高电流效应。相邻栅极之间的横向电流传输包含在宏模型中。宏模型由标准电路元件合成,使其与常用的电路模拟器兼容,并且,除了NPN基极电阻外,只需要容易测量的电气参数即可定义;表1 . Ebers-Moll等效电路用于模拟每个集电极的NPN晶体管作用;q1 Qq在图1中为四门扇出。对大电流NPN电流增益衰减特性进行建模需要对NPN基极重组电流进行适当的划分,并包含基极电阻。图2(a)示出了NPN基区的划分,为一个狭窄的四栅极扇出,基触点最靠近喷射器端。截面A为基接触区域,截面B-E为活动区域。每个有源部分的分数级复合电流由NPN的直流增益来建模,而基极接触区域的分数级复合电流由二极管DCN的饱和电流来表示。使用一套一致的布局规则和制造,需要对不同扇出计数的门进行基本电流测量。图2(b)显示了带有注入电流去电流路径的划分基区,假设注入器位于基区的基极接触端。利用这些阴影电流路径的几何形状和基片电阻,可以确定b - a - e电阻分量。基电阻分量RBI RB ~以-形式包含在宏模型中
CONVENTIONAL integrated injection logicl~’ (12L) has the attractive features of high density, low power-delay product, and simple fabrication sequence. However, the NPN current gain falloff associated with narrow, high fanout 12L gates severely limits the maximum gate operational speed. Furthermore, high current effects reduce injector transport efficiency, thus, increasing the powerdelay product. Figure 1 shows a complete 12L macromodel which includes the NPN current gain falloff and injector high current effects. Lateral current transport between adjacent gates is included in the macromodel’. The macromodel is synthesized from standard circuit elements making it compatible with commonly used circuit simulators, and, except for the NPN base resistance, requires only readily measured electrical parameters for definition; Table I. Ebers-Moll equivalent circuits are used to model the NPN transistor action of each collector; Q 1 Qq in Figure 1 for a fanout of four gate. Modeling the high-current NPN current gain falloff characteristics requires proper partitioning of the NPN base recombination currents and inclusion of the base resistance. Figure 2(a) illustrates the partitioning of the NPN base region for a narrow, fanout of four gate with base contact nearest the injector end. Section A is the base contact region and sections B-E are the active regions. The fractional recombination current for each active section is modeled by the dc current gain of the NPN, whereas, for the base contact region, it is accounted for by the saturation current of diode DCN. Base current measurements are required for gates of differing fanout counts using a consistent set of layout rules and fabrication. Figure 2(b) shows the partitioned base region with injected current de current paths, assuming the injector to be located at the base contact end of the base region. Using the geometry of these shaded current paths and the base sheet resistance, the b a e resistance components may be determined. Base resistance components, RBI R B ~ , are included in the macromodel as -