{"title":"时域衰减全反射法表征有机电光超薄膜太赫兹特性的器件结构","authors":"W. Jin, R. Xu","doi":"10.1109/ICCPS.2015.7454230","DOIUrl":null,"url":null,"abstract":"We developed a new device architecture for characterizing the properties of electro-optic (EO) material from the thin-film device utilizing time-domain attenuated total reflection spectroscopy in the terahertz (THz) frequency region. The properties of the test material showed good agreement with the results from pellets measurements by conventional THz-TDS system.","PeriodicalId":319991,"journal":{"name":"2015 IEEE International Conference on Communication Problem-Solving (ICCP)","volume":"137 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Device architecture for terahertz characterization of organic electro-optic ultra-thin films using time-domain attenuated total reflection method\",\"authors\":\"W. Jin, R. Xu\",\"doi\":\"10.1109/ICCPS.2015.7454230\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We developed a new device architecture for characterizing the properties of electro-optic (EO) material from the thin-film device utilizing time-domain attenuated total reflection spectroscopy in the terahertz (THz) frequency region. The properties of the test material showed good agreement with the results from pellets measurements by conventional THz-TDS system.\",\"PeriodicalId\":319991,\"journal\":{\"name\":\"2015 IEEE International Conference on Communication Problem-Solving (ICCP)\",\"volume\":\"137 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE International Conference on Communication Problem-Solving (ICCP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCPS.2015.7454230\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Conference on Communication Problem-Solving (ICCP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCPS.2015.7454230","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Device architecture for terahertz characterization of organic electro-optic ultra-thin films using time-domain attenuated total reflection method
We developed a new device architecture for characterizing the properties of electro-optic (EO) material from the thin-film device utilizing time-domain attenuated total reflection spectroscopy in the terahertz (THz) frequency region. The properties of the test material showed good agreement with the results from pellets measurements by conventional THz-TDS system.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
