冷阴极c束电老化对焦点光斑大小和x射线剂量的影响

Ketan Bhotkar, Y. Yu, Bishwa Chandra Adhikari, K. Park
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引用次数: 0

摘要

本研究旨在探讨电老化对冷阴极电子束(c束)的影响。本实验以垂直排列的碳纳米管为实验材料,建立了有效电老化的偏压,并将偏压电压定义为焦耳加热发生的电压。在高发射电流下,碳纳米管阵列可以通过老化过程实现长期稳定的场电子发射。此外,使用x射线成像和剂量测量来评估作为标准分辨率测试对象(EN 12543-5)的钨十字丝的焦斑尺寸(FSS)。我们发现老化对FSS没有显著影响,但x射线剂量率从0.45 mGy/sec增加到1.1 mGy/sec。
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Effect of Electrical Aging of Cold Cathode C-Beam on Focal Spot Size and X-Ray Dose
The purpose of this study was to evaluate the effect of electrical aging on the cold cathode electron beam (C-beam). This experiment is performed by the vertically aligned carbon nanotube in which it is established that the applied bias for efficient electrical aging and defined the bias voltage as the voltage at which joule heating occurred. A long-term stable field electron emission from carbon nanotube arrays can be achieved through an aging process at high emission current. Additionally, x-ray imaging and dose measurement were used to assess the Focal Spot Size (FSS) of the tungsten cross wire used as a standard resolution testing object (EN 12543–5). We found that the aging had no significant effect on the FSS, but the x-ray dose rate enhanced from 0.45 mGy/sec to 1.1 mGy/sec.
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