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引用次数: 39

摘要

提出了一种氢氟酸单步电化学腐蚀微加工新技术。在HF中的电化学蚀刻被称为多孔硅形成的技术。采用各向异性和各向同性相结合的刻蚀技术,制备了单晶硅的三维结构。孔的直径或沟槽的宽度可以通过电流密度来控制。首先,形成垂直壁,在获得所需的深度后,通过调节光强来增加电流密度。在不影响现有沟槽宽度的情况下,在结构下增加沟槽宽度。仅用一个掩模就可以实现沟槽的连接并获得独立的独立光束。独立式梁的高度、宽度和长度分别为40 /spl mu/m、2 /spl mu/m和250 /spl mu/m,由单晶硅制成。
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Fabrication of free standing structure using single step electrochemical etching in hydrofluoric acid
This paper presents a new technique of micromachining using single step electrochemical etching in hydrofluoric acid (HF). The electrochemical etching in HF is known as a technique for porous silicon formation. This etching technique is applied to fabricate 3-D structures in single crystal silicon by a combination of anisotropic and isotropic modes. The diameter of the pore or the width of the trench can be controlled by the current density. First, vertical walls are formed and after desired depth is obtained, current density is increased by adjusting the light intensity. The width of the trenches is increased under the structures without effecting the width of existing trenches. The connection of the trenches can be achieved and free standing beams obtained with only one mask. The free standing beams with height, width and length of 40 /spl mu/m, 2 /spl mu/m and 250 /spl mu/m, respectively, are made of single crystal silicon.
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