5 MeV电子辐照半绝缘砷化镓的电学特性

P. Boháček, B. Zat’ko, A. Šagátová, P. Hybler, M. Sekáčová
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引用次数: 1

摘要

在400 K和300 K温度下,测量了5 MeV电子在1kGy ~ 24kgy不同累积剂量和不同剂量率下辐照的未掺杂半绝缘GaAs样品的电阻率、霍尔系数、霍尔迁移率和霍尔浓度。随着累积电子剂量的增加,电阻率和电子霍尔浓度降低,霍尔系数和电子霍尔迁移率增加。在24 kGy的累积电子剂量照射下,300 K时电子霍尔迁移率从6950 cm2/Vs增加到7680 cm2/Vs。
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Electrical properties of semi-insulating GaAs irradiated with 5 MeV electrons
The resistivity, Hall coefficient, Hall mobility, and Hall concentration in undoped semi-insulating GaAs samples irradiated by 5 MeV electrons of various cumulative doses ranging from 1kGy to 24 kGy and different dose rate were measured and analysed at the temperature 400 K and 300 K. The resistivity and the electron Hall concentration decrease while Hall coefficient and the electron Hall mobility increase with increasing cumulative electron dose. The electron Hall mobility increased from 6950 cm2/Vs to about 7680 cm2/Vs at 300 K both samples irradiated with the cumulative electron dose of 24 kGy.
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