{"title":"等离子体增强金属纳米孔径GaAs VCSEL光学近场探测","authors":"J. Hashizume, F. Koyama","doi":"10.1109/ISLC.2004.1382781","DOIUrl":null,"url":null,"abstract":"We demonstrate a metal nano-aperture GaAs VCSEL for sub-wavelength optical near-filed probing, which exhibits the strong plasmon enhancement of both optical near-field intensity and voltage signals by introducing a metal nano-particle in the nano-aperture.","PeriodicalId":126641,"journal":{"name":"2004 IEEE 19th International Semiconductor Laser Conference, 2004. Conference Digest.","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Plasmon enhanced optical near-field probing of metal nano-aperture GaAs VCSEL\",\"authors\":\"J. Hashizume, F. Koyama\",\"doi\":\"10.1109/ISLC.2004.1382781\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We demonstrate a metal nano-aperture GaAs VCSEL for sub-wavelength optical near-filed probing, which exhibits the strong plasmon enhancement of both optical near-field intensity and voltage signals by introducing a metal nano-particle in the nano-aperture.\",\"PeriodicalId\":126641,\"journal\":{\"name\":\"2004 IEEE 19th International Semiconductor Laser Conference, 2004. Conference Digest.\",\"volume\":\"45 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-09-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2004 IEEE 19th International Semiconductor Laser Conference, 2004. Conference Digest.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISLC.2004.1382781\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 IEEE 19th International Semiconductor Laser Conference, 2004. Conference Digest.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISLC.2004.1382781","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Plasmon enhanced optical near-field probing of metal nano-aperture GaAs VCSEL
We demonstrate a metal nano-aperture GaAs VCSEL for sub-wavelength optical near-filed probing, which exhibits the strong plasmon enhancement of both optical near-field intensity and voltage signals by introducing a metal nano-particle in the nano-aperture.
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